Virginia TechAbe, Y.Aberle, C.dos Anjos, J. C.Barriere, J. C.Bergevin, M.Bernstein, A.Bezerra, T. J. C.Bezrukhov, Leonid B.Blucher, E.Bowden, N. S.Buck, C.Busenitz, J.Cabrera, A.Caden, E.Camilleri, LeslieCarr, Rachel E.Cerrada, M.Chang, P. J.Chimenti, P.Classen, T.Collin, A. P.Conover, E.Conrad, Janet M.Crespo-Anadon, J. I.Crum, K.Cucoanes, A. S.D'Agostino, M. V.Damon, E.Dawson, J. V.Dazeley, S.Dietrich, D.Djurcic, ZelimirDracos, M.Durand, V.Ebert, J.Efremenko, Y.Elnimr, M.Erickson, A.Etenko, A.Fallot, M.Fechner, M.von Feilitzsch, F.Felde, J.Fernandes, S. M.Fischer, V.Franco, D.Franke, A. J.Franke, M.Furuta, H.Gama, R.Gil-Botella, I.Giot, L.Goger-Neff, M.Gonzalez, L. F. G.Goodenough, L.Goodman, M. C.Goon, J. T. M.Greiner, D.Haag, N.Habib, S.Hagner, C.Hara, T.Hartmann, F. X.Haser, J.Hatzikoutelis, A.Hayakawa, T.Hofmann, M.Horton-Smith, Glenn A.Hourlier, A.Ishitsuka, M.Jochum, J.Jollet, C.Jones, C. L.Kaether, F.Kalousis, L. N.Kamyshkov, Y.Kaplan, D. M.Kawasaki, T.Keefer, G.Kemp, E.de Kerret, H.Kibe, Y.Konno, T.Kryn, D.Kuze, M.Lachenmaier, TobiasLane, C. E.Langbrandtner, C.Lasserre, T.Letourneau, A.Lhuillier, D.Lima, H. P.Lindner, M.Lopez-Castano, J. M.LoSecco, J. M.Lubsandorzhiev, B. K.Lucht, S.McKee, D.Maeda, J.Maesano, C. N.Mariani, CamilloMaricic, JelenaMartino, J.Matsubara, T.Mention, G.Meregaglia, A.Meyer, M.Miletic, T.Milincic, R.Miyata, H.Mueller, T. A.Nagasaka, Y.Nakajima, K.Novella, P.Obolensky, M.Oberauer, L.Onillon, A.Osborn, A.Ostrovskiy, I.Palomares, C.Pepe, I. M.Perasso, S.Perrin, P.Pfahler, P.Porta, A.Potzel, W.Pronost, G.Reichenbacher, J.Reinhold, B.Remoto, A.Roehling, M.Roncin, R.Roth, S.Rybolt, B.Sakamoto, Y.Santorelli, R.Sato, F.Schoenert, S.Schoppmann, S.Schwetz, T.Shaevitz, Marjorie HansenShimojima, S.Shrestha, D.Sida, J. L.Sinev, V.Skorokhvatov, Mikhail D.Smith, E.Spitz, JoshuaStahl, A.Stancu, IonStokes, Lee F. F.Strait, M.Stuken, A.Suekane, F.Sukhotin, S.Sumiyoshi, T.Sun, Y.Svoboda, R.Terao, K.Tonazzo, A.Toups, M.Thi, H. H. T.Valdiviesso, G. A.Veyssiere, C.Wagner, S.Watanabe, H.White, B.Wiebusch, C.Winslow, L.Worcester, M.Wurm, M.Yermia, F.Zimmer, V.Double Chooz, Collaboration2013-12-182013-12-182013-01-08Abe, Y. ; Aberle, C. ; dos Anjos, J. C. ; et al., JAN 8 2013. “Direct measurement of backgrounds using reactor-off data in Double Chooz,” PHYSICAL REVIEW D 87(1): 011102. DOI: 10.1103/PhysRevD.87.0111021550-7998http://hdl.handle.net/10919/24731Double Chooz is unique among modern reactor-based neutrino experiments studying (nu) over bar (e) disappearance in that data can be collected with all reactors off. In this paper, we present data from 7.53 days of reactor-off running. Applying the same selection criteria as used in the Double Chooz reactor-on oscillation analysis, a measured background rate of 1.0 +/- 0.4 events/day is obtained. The background model for accidentals, cosmogenic beta-n-emitting isotopes, fast neutrons from cosmic muons, and stopped-mu decays used in the oscillation analysis is demonstrated to be correct within the uncertainties. Kinematic distributions of the events, which are dominantly cosmic-ray-produced correlated-background events, are provided. The background rates are scaled to the shielding depths of two other reactor-based oscillation experiments, Daya Bay and RENO.en-USIn CopyrightmuonphysicsmusicrockAstronomy & AstrophysicsPhysicsDirect measurement of backgrounds using reactor-off data in Double ChoozArticle - Refereedhttp://link.aps.org/doi/10.1103/PhysRevD.87.011102Physical Review Dhttps://doi.org/10.1103/PhysRevD.87.011102