Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability

2016-08-242016-08-242008-04-08http://hdl.handle.net/10919/72579An all solutions automatic test pattern generation (ATPG) engine method uses a decision selection heuristic that makes use of the “connectivity of gates” in the circuit in order to obtain a compact solution-set. The “symmetry in search-states” is analyzed using a “Success-Driven Learning” technique which is extended to prune conflict sub-spaces. A metric is used to determine the use of learnt information a priori, which information is stored and used efficiently during “success driven learning”.application/pdfen-USDecision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiabilityPatenthttp://pimg-fpiw.uspto.gov/fdd/47/567/073/0.pdf11194543714/738G01R31/31837G01R31/318307356747