Characterization and modeling of magnetic materials and structures

Simple item page
dc.contributor.authorAl-Mazroo, Abdulhameed Yousefen
dc.contributor.committeechairElshabini-Riad, Aicha A.en
dc.contributor.committeememberBesieris, loannis M.en
dc.contributor.committeememberKohler, Werner E.en
dc.contributor.committeememberRiad, Sedki M.en
dc.contributor.committeememberVorpérian, Vatchéen
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-08-13T14:38:46Zen
dc.date.available2014-08-13T14:38:46Zen
dc.date.issued1988en
dc.description.abstractThis dissertation presents methods for wideband characterization and modeling of magnetic materials and structures over a wide frequency range (dc to a few GHz). A method for modeling the thick film inductor structures at high frequencies is presented in this dissertation. The thick film inductor under test is printed and located in shunt connection at the end of a reference transmission line. Time Domain Reflectometry (TDR) technique is used to measure the response waveform from the inductor under test. The response from a short circuit at the location of the inductor is acquired as the reference waveform. The two acquired waveforms are then transformed into the frequency domain using the Fast Fourier Transform algorithm (FFT). The reflection coefficient is then computed as the ratio between the Fourier Transforms of the response and reference waveforms. From the information contained, the complex impedance of the structure under study can be calculated. This information is used for modeling that structure by fitting the data to the network model using the computer network analysis program. Experimental and simulated response waveforms are compared and brought to a close match by changing the model components values. A cavity-like sample holder filled with ferrite material ls proposed in this dissertation to measure the complex permeability of the magnetic material filling this cavity. The cavity walls are deposited on a coaxially shaped sample using thick film techniques. The reflection coefficient from the cavity under study is measured by adapting the cavity to the end of a transmission line. The full field analysis of this proposed configuration is used to determine a relationship between the complex permeability of the ferrite material and the measured reflection coefficient. The method of moments ls used to achieve this task. Computer simulation experiments are performed to test the sensitivity of the technique and to predict the performance over the desired frequency range. Actual experimentation as well as verifications of these measurements are conducted to verify the merit of the proposed technique.en
dc.description.adminincomplete_metadataen
dc.description.degreePh. D.en
dc.format.extentviii, 169 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/49915en
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 19646936en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V856 1988.A4465en
dc.subject.lcshMagnetic materialsen
dc.subject.lcshThick-film circuitsen
dc.titleCharacterization and modeling of magnetic materials and structuresen
dc.typeDissertationen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.leveldoctoralen
thesis.degree.namePh. D.en

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
LD5655.V856_1988.A4465.pdf
Size:
3.42 MB
Format:
Adobe Portable Document Format
Description:
Download

Collections

Doctoral Dissertations