Browsing by Author "Hunter, Jerry L."

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    Effect of Chemistry on the Transformation of Austenite to Martensite for Intercritically Austempered Ductile Iron
    Banerjee, Sayanti (Virginia Tech, 2013-01-11)
    Intercritically austempered ductile iron (IADI) with a matrix microstructure of ferrite plus metastable austenite has an excellent combination of strength and toughness. The high strength and good ductility of this material is due to the transformation of metastable austenite to martensite during deformation. In the present study, the transformation of austenite to martensite for intercritically austempered ductile irons of varying alloy chemistry (varying amounts of nickel and/or manganese) were examined using in-situ neutron diffraction under strain-controlled loading at VULCAN at the Spallation Neutron Source at Oak Ridge National Laboratory (ORNL). Both diffraction and tensile data were collected and synced using the VDRIVE software (a proprietary ORNL software package). The single peak fit method was employed in the analysis of the diffraction data. In this thesis, the stress and strain for the start of the transformation of metastable austenite to martensite were determined. The development of residual stresses during deformation and the elastic diffraction constants for both the ferrite and austenite phases were also determined. The material was characterized using optical microscopy, backscattered imaging in the scanning electron microscopy, energy dispersive spectroscopy and transmission electron microscopy.
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    A Fundamental Study on the Relocation, Uptake, and Distribution of the Cs⁺ Primary Ion Beam During the Secondary Ion Mass Spectrometry Analysis
    Giordani, Andrew J. (Virginia Tech, 2016-04-01)
    Combining cesium (Cs) bombardment with positive secondary molecular ion detection (MCs+) can extend the analysis capability of Secondary Ion Mass Spectrometry (SIMS) from the dilute limit (<1%) to matrix elements. The MCs+ technique has had great success in quantifying the sample composition of III-V semiconductors as well as dopants and/or impurities; however, it has been less effective at reducing the matrix effect for IV compounds, particularly Si-containing compounds, due to Cs overloading at the surface during the analysis from the Cs primary ion beam. The Cs overloading issue is attributable to the mobility and relocation of the implanted Cs to the surface; this effect happens almost instantaneously. Once the surface is overloaded with Cs, the excess Cs begins to reneutralize the ionization Cs and, as a result, the MCs+ technique is ineffective at reducing the matrix effect. This research provides new insights for improving the MCs+ technique and elucidating the Cs mobility. A combination of multiple experimental techniques and theoretical modeling was implemented to assess the Cs retention, up-take, and distribution differences between group III-V and IV materials. Early experiments revealed a temperature-dependent component of the Cs mobility, prompting an investigation of this phenomenon. Therefore, we designed, built, and installed a variable temperature stage for our SIMS with temperatures ranging from -150 to 300 C. This enabled us to study the temperature-dependent component of the Cs mobility and the effect it has on the secondary ion emission processes. Additionally, a method was devised to quantify the amount of neutralization and ionization due to the relocated Cs. The results allow for a more thorough understanding of the material dependence on the Cs+-sample interaction and the temperature component of the Cs mobility.