Browsing by Author "Lee, J. K."

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    Characterization and elimination of dry etching damaged layer in Pt/Pb(Zr0.53Ti0.47)O-3/Pt ferroelectric capacitor
    Lee, J. K.; Kim, T. Y.; Chung, Ilsub; Desu, Seshu B. (AIP Publishing, 1999-07-01)
    The damage of Pb(Zr0.53Ti0.47)O-3 thin film due to dry etching process was characterized in terms of the microstructure and electrical properties. The damaged layer seems to be amorphous and the thickness of the damaged layer is about 10 nm. The existence of such a layer in Pt/Pb(Zr0.53Ti0.47)O-3/Pt ferroelectric capacitor tends to increase the coercive voltage and the leakage current. The damaged layer was not fully reverted to perovskite phase by the thermal annealing. With the wet cleaning treatment, however, the damaged layer was successfully removed thereby revealing significantly improved electrical properties. (C) 1999 American Institute of Physics. [S0003-6951(99)00529-X].
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    Effect of sample preparation on prediction of fermentation quality of maize silages by near infrared reflectance spectroscopy
    Park, H. S.; Lee, J. K.; Fike, John H.; Kim, D. A.; Ko, M. S.; Ha, J. K. (2005-05)
    Near infrared reflectance spectroscopy (NIRS) has become increasingly used as a rapid, accurate method of evaluating some chemical constituents in cereal grains and forages. If samples could be analyzed without drying and grinding, then sample preparation time and costs may be reduced. This study was conducted to develop robust NIRS equations to predict fermentation quality of corn (Zea mays) silage and to select acceptable sample preparation methods for prediction of fermentation products in corn silage by NIRS. Prior to analysis, samples (n = 112) were either oven-dried and ground (01)), frozen in. liquid nitrogen and ground (LN) and intact fresh (IF). Samples were scanned from 400 to 2,500 nm with an NIRS 6,500 monochromator. The samples were-divided into calibration and validation sets. The spectral data were regressed on a range of dry matter (DM), pH and short chain organic acids using modified multivariate partial least squares (MPLS) analysis that used first and second order derivatives. All chemical analyses were conducted with fresh samples. From these treatments, calibration equations were developed successfully for concentrations of all constituents except butyric acid. Prediction accuracy, represented by standard error of prediction (SEP) and R-2 (variance accounted for in validation set), was slightly better with the LN treatment (R-2 0.75-0.90) than for OD (R-2 0.43-0.81) or IF (R-2 0.62-0.79) treatments. Fermentation characteristics could be successfully predicted by NIRS analysis either with dry or fresh silage. Although statistical results for the OD and IF treatments were the lower than those of LN treatment, intact fresh (IF) treatment may be acceptable when processing is costly or when possible component alterations are expected.
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    Search for the B -> Y(4260)K, Y(4260) -> J/psi pi(+)pi(-) decays
    Garg, R.; Bhardwaj, V.; Singh, J. B.; Adachi, I.; Ahn, J. K.; Aihara, H.; Al Said, S.; Asner, D. M.; Aulchenko, V.; Aushev, T.; Ayad, R.; Babu, V.; Bahinipati, S.; Bansal, V.; Beleno, C.; Bilka, T.; Biswal, J.; Bobrov, A.; Bozek, A.; Bračko, M.; Cao, L.; Cervenkov, D. T.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, H. E.; Cho, K.; Choi, S.-K.; Choi, Y.; Cinabro, D.; Cunliffe, S.; Dash, N.; Di Carlo, S.; Doležal, Z.; Dong, T. V.; Drasal, Z.; Eidelman, S.; Fast, J. E.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Giri, A.; Golob, B.; Grzymkowska, O.; Haba, J.; Hayasaka, K.; Hayashii, H.; Hou, W.-S.; Hsu, C.-L.; Inami, K.; Inguglia, G.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jeon, H. B.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Julius, T.; Kaliyar, A. B.; Kawasaki, T.; Kichimi, H.; Kim, D. Y.; Kim, J. B.; Kim, S. H.; Kinoshita, K.; Kodyš, P.; Korpar, S.; Kotchetkov, D.; Križan, P.; Kroeger, R.; Krokovny, P.; Kuhr, T.; Kumar, R.; Kwon, Y-J.; Lange, J. S.; Lee, J. K.; Lee, S. C.; Li, C. H.; Li, L. K.; Li, Y. B.; Gioi, L. Li; Libby, J.; Liventsev, D.; Lu, P-C.; Luo, T.; MacNaughton, J.; Masuda, M.; Matsuda, T.; Matvienko, D.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mori, T.; Mussa, R.; Nakao, M.; Nath, K. J.; Nayak, M.; Nishida, S.; Nishimura, K.; Ogawa, S.; Ono, H.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Patra, S.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, Leo E.; Popov, V.; Prasanth, K.; Prencipe, E.; Resmi, P. K.; Rostomyan, A.; Russo, G.; Sakai, Y.; Salehi, M.; Sandilya, S.; Sanuki, T.; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shebalin, V.; Shen, C. P.; Shibata, T. A.; Shiu, J-G.; Sokolov, A.; Solovieva, E.; Starič, M.; Stottler, Z. S.; Sumihama, M.; Sumiyoshi, T.; Takizawa, M.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Usov, Y.; Van Tonder, R.; Varner, G.; Varvell, K. E.; Waheed, E.; Wang, B.; Wang, C. H.; Wang, M-Z.; Wang, P.; Wang, X. L.; Watanabe, M.; Won, E.; Yang, S. B.; Ye, H.; Yelton, J.; Yin, J. H.; Yuan, C. Z.; Zhang, Z. P.; Zhilich, V.; Zhukova, V.; Zhulanov, V. (2019-04-12)
    We report the results of a search for the B -> Y(4260)K, Y(4260) -> J/psi pi(+)pi thorn p-decays. This study is based on a data sample corresponding to an integrated luminosity of 711 fb(-1), collected at the Upsilon(4S) resonance with the Belle detector at the KEKB asymmetric-energy e(+)e(-) collider. We investigate the J/psi pi(+)pi(-) thorn p-invariant mass distribution in the range 4.0 to 4.6 GeV/c(2) using both B+ -> J/psi pi(+)pi K--(+) and B-0 -> J/psi pi(+)pi K--(S)0 decays. We find excesses of events above the background levels, with significances of 2.1 and 0.9 standard deviations for charged and neutral B -> Y(4260)K decays, respectively, taking into account the systematic uncertainties. These correspond to upper limits on the product of branching fractions, B(B+ -> Y(4260)K+) x B(Y(4260) -> J/psi pi(+)pi(-)) < 1.4 x 10(-5) and B(B-0 -> Y(4260)K-0) x B(Y(4260) -> J/psi pi(+)pi(-)) < 1.7 x 10(-5) at the 90% confidence level.
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    Search for the decay B-s(0) -> eta eta
    Bhuyan, B.; Nath, K. J.; Borah, J.; Adachi, I.; Aihara, H.; Al Said, S.; Asner, D. M.; Atmacan, H.; Aulchenko, V.; Aushev, T.; Ayad, R.; Babu, V.; Badhrees, I.; Bakich, A. M.; Behera, P.; Bennett, J.; Bhardwaj, V.; Bilka, T.; Biswal, J.; Bobrov, A.; Bozek, A.; Bracko, M.; Browder, T. E.; Campajola, M.; Chekelian, V.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, K.; Choi, S. -K.; Choi, Y.; Choudhury, S.; Cinabro, D.; Cunliffe, S.; Dash, N.; Di Capua, F.; Di Carlo, S.; Dolezal, Z.; Dong, T.; Dubey, S.; Eidelman, S.; Fast, J. E.; Ferber, T.; Fulsom, B. G.; Gaur, V.; Gabyshev, N.; Garmash, A.; Giri, A.; Goldenzweig, P.; Golob, B.; Haba, J.; Hara, T.; Hartbrich, O.; Hayasaka, K.; Hayashii, H.; Hou, W. -S.; Iijima, T.; Inami, K.; Inguglia, G.; Ishikawa, A.; Itoh, R.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Kaliyar, A. B.; Kang, K. H.; Karyan, G.; Kawasaki, T.; Kichimi, H.; Kiesling, C.; Kim, D. Y.; Kim, H. J.; Kim, K. T.; Kim, S. H.; Kinoshita, K.; Kodys, P.; Korpar, S.; Kotchetkov, D.; Krizan, P.; Kroeger, R.; Krokovny, P.; Kumar, R.; Kuzmin, A.; Kwon, Y. -J.; Lange, J. S.; Lee, J. K.; Lee, J. Y.; Lee, S. C.; Li, C. H.; Li, L. K.; Li, Y. B.; Li Gioi, L.; Libby, J.; Lieret, K.; Liventsev, D.; Lu, P. -C.; Luo, T.; MacNaughton, J.; MacQueen, C.; Masuda, M.; Matvienko, D.; Merola, M.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mori, T.; Mussa, R.; Nakano, T.; Nakao, M.; Nayak, M.; Niiyama, M.; Nisar, N. K.; Nishida, S.; Ogawa, K.; Ogawa, S.; Ono, H.; Onuki, Y.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pang, T.; Pardi, S.; Park, H.; Patra, S.; Paul, S.; Pedlar, T. K.; Pestotnik, R.; Piilonen, L. E.; Popov, V.; Prencipe, E.; Ritter, M.; Rostomyan, A.; Russo, G.; Sakai, Y.; Salehi, M.; Sandilya, S.; Santelj, L.; Sanuki, T.; Savinov, V.; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Schwartz, A. J.; Seino, Y.; Senyo, K.; Sevior, M. E.; Shebalin, V.; Shen, C. P.; Shiu, J. -G.; Solovieva, E.; Sumiyoshi, T.; Sutcliffe, W.; Takizawa, M.; Tamponi, U.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Urquijo, P.; Usov, Y.; Vahsen, S. E.; Van Tonder, R.; Varner, G.; Vossen, A.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Wiechczynski, J.; Won, E.; Yang, S. B.; Ye, H.; Yin, J. H.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhukova, V. (American Physical Society, 2022-01-11)
    We report results from a search for the decay Bs0→ηη using 121.4 fb-1 of data collected at the (5S) resonance with the Belle detector at the KEKB asymmetric-energy e+e- collider. We do not observe any signal and set an upper limit on the branching fraction of 14.3×10-5 at 90% confidence level. This result represents a significant improvement over the previous most stringent limit.