Virginia Tech GIS and Remote Sensing Research Symposium
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Browsing Virginia Tech GIS and Remote Sensing Research Symposium by Subject "Crop phenology"
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- Analysis of Crop Phenology Using Time-Series MODIS Data and Climate DataRen, Jie; Campbell, James B. Jr.; Shao, Yang; Thomas, R. Quinn (2014)Understanding crop phenology is fundamental to agricultural production, management, planning and decision-making. In the continental United States, key phenological stages are strongly influenced by meteorological and climatological conditions. This study used remote sensing satellite data and climate data to determine key phenological states of corn and soybean and evaluated estimates of these phenological parameters. A time series of Moderate Resolution Imaging Spectrometer (MODIS) Normalized Difference Vegetation Index (NDVI) 16-day composites from 2001 to 2013 was analyzed with the TIMESAT program to automatically retrieve key phenological stages such as the start of season (emergence), peak (heading) and end of season (maturity). These stages were simulated with 6 hourly temperature data from 1980 to 2013 on the basis of crop model under the Community Land Model (CLM) (version 4.5). With these two methods, planting date, heading date, harvesting date, and length of growing season from 2001 to 2013 were determined and compared. There should be a good correlation between estimates derived from satellites and estimates produced with the climate data based on the crop model.