Now showing items 1-10 of 515
Mapping Nonsquare and Unevenly Spaced 2-D SLDV Data of an Aircraft Fuselage by Using Spatial DFT-IDFT Techniques
The scanning laser Doppler vibrometry (SLDV) technique provides velocities of a structure at 2-dimensional (2-D) angularly evenly spaced (in the laser scanning sense) data points. This causes an unevenly spaced data point ...
Peano compactifications and property metric spaces
Let (X,d) denote a locally connected, connected separable metric space. We say the X is S-metrizable provided there is a topologically equivalent metric ρ on X such that (X,ρ) has Property S, i.e. for any ϵ>0, X is the ...
Block-Level Logic Extraction from CMOS VLSILayouts
This paper describes a Prolog based Block Extraction System (ProBES) which converts a transistor level descriptionof a CMOS circuit into a logic block level description. The operation of ProBES is conceptually similar to ...
An Efficient Automatic Test Pattern Generator forStuck-Open Faults in CMOS Combinational Circuits
In this paper, we describe a highly efficient automatic test pattern generator for stuck-open (SOP) faults, calledSOPRANO, in CMOS combinational circuits. The key idea of SOPRANO is to convert a CMOS circuit into anequivalent ...
Parametrically Excited Nonlinear Two-Degree-of-Freedom Systems with Repeated Natural Frequencies
The method of normal forms is used to study the nonlinear response of two-degree-of-freedom systems with repeated natural frequencies and cubic nonlinearity to a principal parametric excitation. The linear part of the ...
Investigation of Subcombination Internal Resonances in Cantilever Beams
Activation of subcombination internal resonances in transversely excited cantilever beams is investigated. The effect of geometric and inertia nonlinearities, which are cubic in the governing equation of motion, is considered. ...
Dynamic Response of Cantilevered Thin-Walled Beams to Blast and Sonic-Boom Loadings
New River Valley transit study: Summary final report
Food Inspection and Analysis
(John Wiley, 1913)
The Bugle, 1980
(Virginia Tech, 1980)
Yearbook for Virginia Tech in Blacksburg, Virginia. The yearbook includes information about the school as well as photographs and illustrations of the student body, teachers, organizations, and buildings.