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dc.contributorVirginia Techen_US
dc.contributor.authorOu, H. Y.en_US
dc.contributor.authorPoon, Ting-Chungen_US
dc.contributor.authorWong, K. K. Y.en_US
dc.contributor.authorLam, Edmund Y.en_US
dc.date.accessioned2014-03-14T15:04:26Z
dc.date.available2014-03-14T15:04:26Z
dc.date.issued2013-05-01
dc.identifier.citationHaiyan Ou, Ting-Chung Poon, Kenneth K. Y. Wong, and Edmund Y. Lam, "Depth resolution enhancement in double-detection optical scanning holography," Appl. Opt. 52, 3079-3087 (2013); doi: 10.1364/ao.52.003079
dc.identifier.issn1559-128X
dc.identifier.urihttp://hdl.handle.net/10919/25901
dc.description.abstractWe propose an optical scanning holography system with enhanced axial resolution using two detections at different depths. By scanning the object twice, we can obtain two different sets of Fresnel zone plates to sample the same object, which in turn provides more information for the sectional image reconstruction process. We develop the computation algorithm that makes use of such information, solving a constrained optimization problem using the conjugate gradient method. Simulation results show that this method can achieve a depth resolution up to 1 mu m. (C) 2013 Optical Society of America
dc.description.sponsorshipResearch Grants Council of the Hong Kong Special Administrative Region, China HKU 7138/11E, 7131/12E
dc.description.sponsorshipNational Natural Science Foundation of China 61107018
dc.description.sponsorshipFundamental Research Funds for the Central Universities ZYGX2011J033
dc.description.sponsorshipChinese Academy of Sciences 2010T2G17
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherOptical Society of America
dc.subjectSectional image-reconstructionen_US
dc.subjectCompressive holographyen_US
dc.subjectMicroscopyen_US
dc.subjectSpaceen_US
dc.titleDepth resolution enhancement in double-detection optical scanning holographyen_US
dc.typeArticleen_US
dc.identifier.urlhttp://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-52-13-3079
dc.date.accessed2014-02-06
dc.title.serialApplied Optics
dc.identifier.doihttps://doi.org/10.1364/ao.52.003079
dc.type.dcmitypeTexten_US


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