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dc.contributorVirginia Techen_US
dc.contributor.authorNamboodri, S. L.en_US
dc.contributor.authorDavis, William A.en_US
dc.contributor.authorKander, R. G.en_US
dc.date.accessioned2014-04-09T18:12:22Z
dc.date.available2014-04-09T18:12:22Z
dc.date.issued1994-04-01
dc.identifier.citationNamboodri, S. L.; Davis, W. A.; Kander, R. G., "measuring microwave shielding effectiveness in liquid-nitrogen," Rev. Sci. Instrum. 65, 1002 (1994); http://dx.doi.org/10.1063/1.1145103
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/10919/47059
dc.description.abstractA technique to distinguish between materials that can and cannot shield microwaves in liquid nitrogen was developed. The samples are placed in a modified X-band waveguide, which operates by the same ''insertion loss'' principle as a coaxial device used to measure shielding effectiveness from 300 to 1000 MHz. Verification of the waveguide fixture was accomplished by measuring the shielding effectiveness of a good conductor, coppper; a nonconductor, Teflon; and two intermediate conductors, steel and a carbon-filled elastomer. After verification, the waveguide fixture was used at liquid nitrogen temperatures to compare the shielding effectiveness of YBa2Cu3O7-x, a high temperature superconductor, with copper, a known shielding material.
dc.description.sponsorshipNSF
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherAIP Publishing
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectCopperen_US
dc.subjectHigh temperature superconductorsen_US
dc.subjectMicrowavesen_US
dc.subjectPolymer waveguidesen_US
dc.subjectElastomeric polymersen_US
dc.subjectMicrowave spectroscopyen_US
dc.subjectSuperconductorsen_US
dc.titleMeasuring Microwave Shielding Effectiveness in Liquid-Nitrogenen_US
dc.typeArticle - Refereeden_US
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/rsi/65/4/10.1063/1.1145103
dc.date.accessed2014-03-20
dc.title.serialReview of Scientific Instruments
dc.identifier.doihttps://doi.org/10.1063/1.1145103
dc.type.dcmitypeTexten_US


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