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Computer Simulation of a Hardness Indent Test into Nickel Nano Thin Films

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dc.contributor.authorParker, Edwarden
dc.contributor.authorGaudreau, Peteren
dc.contributor.editorPoquette, Benen
dc.date.accessioned2019-06-19T21:11:13Zen
dc.date.available2019-06-19T21:11:13Zen
dc.date.issued2006-09-22en
dc.description.abstractCurrent experiments suggest that mechanical properties of thin films are different at thicknesses less than 100 nm.In this study, embedded atom method computer simulations are used to examine the differences in strengthening mechanisms at the nano scale.The simulation shows the mechanisms responsible for the differences in hardness with varying sample thicknesses from 12.8, 8, 6, and 4 nm.The simulation results show that as film thickness decreases the hardness of the film increases.Simulations were performed in single crystal films as well as model tricristals in order to study the effects of the grain boundaries.Tricrystalline films emitted dislocations at a lower pressure than single crystals.en
dc.format.extent5 pagesen
dc.format.extent857.43 KBen
dc.format.mimetypeapplication/pdfen
dc.format.mimetypeapplication/zipen
dc.identifier.citationParker, E. and Gaudreau, P., 2006. Computer Simulation of a Hardness Indent Test into Nickel Nano Thin Films. Journal of Undergraduate Materials Research, 2. DOI: http://doi.org/10.21061/jumr.v2i0.0602en
dc.identifier.doihttps://doi.org/10.21061/jumr.v2i0.0602en
dc.identifier.eissn2578-9570en
dc.identifier.issn1934-7677en
dc.identifier.issue1en
dc.identifier.urihttp://hdl.handle.net/10919/90320en
dc.identifier.volume2en
dc.language.isoenen
dc.publisherVirginia Tech Department of Materials Science and Engineeringen
dc.rightsIn Copyrighten
dc.rights.holderVirginia Tech Department of Materials Science and Engineeringen
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectMaterials Scienceen
dc.subjectEmbedded Atom Methoden
dc.titleComputer Simulation of a Hardness Indent Test into Nickel Nano Thin Filmsen
dc.title.serialJournal of Undergraduate Materials Researchen
dc.typeArticleen
dc.type.dcmitypeTexten

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