Statistical Monitoring of Nonlinear Product and Process Quality Profiles
| dc.contributor.author | Williams, James D. | en |
| dc.contributor.author | Woodall, William H. | en |
| dc.contributor.author | Birch, Jeffrey B. | en |
| dc.contributor.department | Statistics | en |
| dc.date.accessioned | 2019-05-08T19:46:15Z | en |
| dc.date.available | 2019-05-08T19:46:15Z | en |
| dc.date.issued | 2007 | en |
| dc.description.abstract | In many quality control applications, use of a single (or several distinct) quality characteristic(s) is insufficient to characterize the quality of a produced item. In an increasing number of cases, a response curve (profile), is required. Such profiles can frequently be modeled using linear or nonlinear regression models. In recent research others have developed multivariate T² control charts and other methods for monitoring the coefficients in a simple linear regression model of a profile. However, little work has been done to address the monitoring of profiles that can be represented by a parametric nonlinear regression model. Here we extend the use of the T² control chart to monitor the coefficients resulting from a parametric nonlinear regression model fit to profile data. We give three general approaches to the formulation of the T² statistics and determination of the associated upper control limits for Phase I applications. We also consider the use of nonparametric regression methods and the use of metrics to measure deviations from a baseline profile. These approaches are illustrated using the vertical board density profile data presented in Walker and Wright[1]. | en |
| dc.description.sponsorship | EPA STAR Grant RD 83136801-0. | en |
| dc.format.extent | 25 pages | en |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.sourceurl | https://www.stat.vt.edu/content/dam/stat_vt_edu/graphics-and-pdfs/research-papers/Technical_Reports/TechReport07-2.pdf | en |
| dc.identifier.uri | http://hdl.handle.net/10919/89400 | en |
| dc.language.iso | en | en |
| dc.publisher | Virginia Tech | en |
| dc.relation.ispartofseries | Technical Report No. 07-2 | en |
| dc.rights | In Copyright | en |
| dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
| dc.subject | Consensus matrix | en |
| dc.subject | label-switching | en |
| dc.subject | model-based clustering | en |
| dc.subject | Monte Carlo simulation | en |
| dc.subject | principal coordinates analysis | en |
| dc.subject | similarity and dissimilarity | en |
| dc.title | Statistical Monitoring of Nonlinear Product and Process Quality Profiles | en |
| dc.type | Technical report | en |
| dc.type.dcmitype | Text | en |
Files
Original bundle
1 - 1 of 1