Wide scanning spherical antenna

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5459475.pdf (1.03 MB)
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Date

1995-10-17

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United States Patent and Trademark Office

Abstract

A novel method for calculating the surface shapes for subreflectors in a suboptic assembly of a tri-reflector spherical antenna system is introduced, modeled from a generalization of Galindo-Israel's method of solving partial differential equations to correct for spherical aberration and provide uniform feed to aperture mapping. In a first embodiment, the suboptic assembly moves as a single unit to achieve scan while the main reflector remains stationary. A feed horn is tilted during scan to maintain the illuminated area on the main spherical reflector fixed throughout the scan thereby eliminating the need to oversize the main spherical reflector. In an alternate embodiment, both the main spherical reflector and the suboptic assembly are fixed. A flat mirror is used to create a virtual image of the suboptic assembly. Scan is achieved by rotating the mirror about the spherical center of the main reflector. The feed horn is tilted during scan to maintain the illuminated area on the main spherical reflector fixed throughout the scan.

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