X-ray and XPS studies of evaporated cuxs thin-films
dc.contributor | Virginia Tech | en |
dc.contributor.author | Uppal, P. N. | en |
dc.contributor.author | Burton, Larry C. | en |
dc.contributor.department | Electrical and Computer Engineering | en |
dc.date.accessed | 2014-05-09 | en |
dc.date.accessioned | 2014-05-14T13:35:40Z | en |
dc.date.available | 2014-05-14T13:35:40Z | en |
dc.date.issued | 1983-04-01 | en |
dc.description.abstract | The structural changes in Cu x S films have been monitored by x_ray diffraction and correlated to the chemical changes taking place on the Cu x S surface, the latter monitored by XPS. The results show: evaporated Cu x S films contained chalcocite, free copper phases, and probably a third phase (of sulfur); resistivity is related to the amounts of free Cu and S in the film; air heat treatments converted chalcocite to Cu deficient phases and resulted in the disappearance of the sulfide and predominance of CuSO4_nH2O and CuO; argon heat treatment tended to react Cu and S to form Cu x S; Cd is detected on the surface of Cu x S deposited onto CdS and is significantly increased in amount by heat treatments. These results can be related to chemical processes occurring on Cu x S/CdS and Cu x S/(Zn,Cd)S solar cells. For the CdS cell, oxides and sulfates of Cu and Cd are found on the Cu x S surface and the sulfates are enhanced by the heat treatment in moist air. CuO and CuSO4 are formed in the absence of Cd, and dominate the Cu x S surface. | en |
dc.description.sponsorship | Solar Energy Research Institute No. XS-O-9075-1 | en |
dc.description.sponsorship | Chevron Research Company | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Uppal, P. N.; Burton, L. C., "X-ray and XPS studies of evaporated cuxs thin-films," J. Vac. Sci. Technol. A 1, 479 (1983); http://dx.doi.org/10.1116/1.571908 | en |
dc.identifier.doi | https://doi.org/10.1116/1.571908 | en |
dc.identifier.issn | 0734-2101 | en |
dc.identifier.uri | http://hdl.handle.net/10919/47992 | en |
dc.identifier.url | http://scitation.aip.org/content/avs/journal/jvsta/1/2/10.1116/1.571908 | en |
dc.language.iso | en | en |
dc.publisher | American Institute of Physics | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Materials science, coatings & films | en |
dc.subject | Physics, applied | en |
dc.title | X-ray and XPS studies of evaporated cuxs thin-films | en |
dc.title.serial | Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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