X-ray and XPS studies of evaporated cuxs thin-films

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dc.contributorVirginia Techen
dc.contributor.authorUppal, P. N.en
dc.contributor.authorBurton, Larry C.en
dc.contributor.departmentElectrical and Computer Engineeringen
dc.date.accessed2014-05-09en
dc.date.accessioned2014-05-14T13:35:40Zen
dc.date.available2014-05-14T13:35:40Zen
dc.date.issued1983-04-01en
dc.description.abstractThe structural changes in Cu x S films have been monitored by x_ray diffraction and correlated to the chemical changes taking place on the Cu x S surface, the latter monitored by XPS. The results show: evaporated Cu x S films contained chalcocite, free copper phases, and probably a third phase (of sulfur); resistivity is related to the amounts of free Cu and S in the film; air heat treatments converted chalcocite to Cu deficient phases and resulted in the disappearance of the sulfide and predominance of CuSO4_nH2O and CuO; argon heat treatment tended to react Cu and S to form Cu x S; Cd is detected on the surface of Cu x S deposited onto CdS and is significantly increased in amount by heat treatments. These results can be related to chemical processes occurring on Cu x S/CdS and Cu x S/(Zn,Cd)S solar cells. For the CdS cell, oxides and sulfates of Cu and Cd are found on the Cu x S surface and the sulfates are enhanced by the heat treatment in moist air. CuO and CuSO4 are formed in the absence of Cd, and dominate the Cu x S surface.en
dc.description.sponsorshipSolar Energy Research Institute No. XS-O-9075-1en
dc.description.sponsorshipChevron Research Companyen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationUppal, P. N.; Burton, L. C., "X-ray and XPS studies of evaporated cuxs thin-films," J. Vac. Sci. Technol. A 1, 479 (1983); http://dx.doi.org/10.1116/1.571908en
dc.identifier.doihttps://doi.org/10.1116/1.571908en
dc.identifier.issn0734-2101en
dc.identifier.urihttp://hdl.handle.net/10919/47992en
dc.identifier.urlhttp://scitation.aip.org/content/avs/journal/jvsta/1/2/10.1116/1.571908en
dc.language.isoenen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectMaterials science, coatings & filmsen
dc.subjectPhysics, applieden
dc.titleX-ray and XPS studies of evaporated cuxs thin-filmsen
dc.title.serialJournal of Vacuum Science & Technology a-Vacuum Surfaces and Filmsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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