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SBES Advanced Multi-scale CT Facility at Virginia Tech - From Multi-scale to Multi-energy and Multi-Parameter Imaging Capabilities

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dc.contributorVirginia Tech-Wake Forest University School of Biomedical Engineering and Sciencesen
dc.contributor.authorWang, Geen
dc.contributor.authorWyatt, Christopher Leeen
dc.contributor.authorYu, Hengyongen
dc.contributor.authorSharma, Kriti S.en
dc.contributor.authorPrater, Mary R.en
dc.contributor.authorXiao, Shuhaien
dc.contributor.authorMarkert, Chaden
dc.contributor.authorSaul, Justinen
dc.contributor.authorFox, Edward A.en
dc.contributor.authorLee, Seung W.en
dc.contributor.authorFeser, Michaelen
dc.contributor.authorLau, S. H.en
dc.contributor.authorYun, Wenbingen
dc.contributor.authorWang, Steveen
dc.contributor.departmentSchool of Biomedical Engineering and Sciencesen
dc.date.accessed2014-11-26en
dc.date.accessioned2015-10-06T15:29:56Zen
dc.date.available2015-10-06T15:29:56Zen
dc.date.issued2010-04-05en
dc.description.abstractWhile clinical CT scanners are available at our medical school, for preclinical imaging we have a Scanco micro-CT scanner, an Xradia micro-CT scanner and an Xradia nano-CT scanner. With all these scanners, we can cover image resolution and sample size over six orders of magnitude. The Scanco scanner has resolution 16 µm and FOV 20-38 mm. The Xradia micro-CT scanner, purchased using an NIH SIG grant in 2008, is the highest resolution micro-CT system on the market. It produces 0.5 µm resolution and handle samples of up to 100 mm diameter. The Xradia nano-CT scanner, purchased using an NSF-MRI grant in 2009, has 50 nm resolution and represents the state-of-the-art. It allows tomographic imaging in either the attenuation or Zernike phase contrast mode. For the high-resolution performance of the micro-/nano-CT systems, special housing is vital to ensuring technical development and biomedical applications. We have a dedicated space for these systems in the Institute for Critical Technologies and Applied Sciences (ICTAS; http://www.ictas.vt.edu) Building A, adjacent to the Nanoscale Characterization and Fabrication Lab (NCFL; http://www.ictas.vt.edu/NCFL) at Virginia Tech, which hosts most other cutting-edge imaging systems under one roof.en
dc.description.sponsorshipNational Center for Research Resources (U.S.) - Grant RR025667en
dc.description.sponsorshipNational Science Foundation (U.S.). Division of Civil, Mechanical and Manufacturing Innovation - Grant 0923297en
dc.format.mimetypeapplication/pdfen
dc.identifier.citationWang, G., Wyatt, C. L., Yu, H., Sharma, K. S., Prater, R., Xiao, S., Markert, C., Saul, J., Fox, E. A., Lee, S. W., Feser, M., Lau, S. H., Yun, W., & Wang, S. (2010). Sbes Advanced Multi-Scale CT Facility at Virginia Tech - from Multi-Scale to Multi-Energy and Multi-Parameter Imaging Capabilities. Poster. Retrieved from http://www.imaging.sbes.vt.edu/posters/Poster-Wang-SAM.pdfen
dc.identifier.urihttp://hdl.handle.net/10919/56705en
dc.identifier.urlhttp://www.imaging.sbes.vt.edu/posters/Poster-Wang-SAM.pdfen
dc.language.isoen_USen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectMicro-CT scanneren
dc.subjectNano-CT scanneren
dc.subjectBiomedicalen
dc.titleSBES Advanced Multi-scale CT Facility at Virginia Tech - From Multi-scale to Multi-energy and Multi-Parameter Imaging Capabilitiesen
dc.typePosteren
dc.type.dcmitypeTexten

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