1 kV GaN-on-Si Quasi-Vertical Schottky Rectifier
dc.contributor.author | Qin, Yuan | en |
dc.contributor.author | Xiao, Ming | en |
dc.contributor.author | Zhang, Ruizhe | en |
dc.contributor.author | Xie, Qingyun | en |
dc.contributor.author | Palacios, Tomás | en |
dc.contributor.author | Wang, Boyan | en |
dc.contributor.author | Ma, Yunwei | en |
dc.contributor.author | Kravchenko, Ivan | en |
dc.contributor.author | Briggs, Dayrl P. | en |
dc.contributor.author | Hensley, Dale K. | en |
dc.contributor.author | Srijanto, Bernadeta R. | en |
dc.contributor.author | Zhang, Yuhao | en |
dc.date.accessioned | 2024-04-08T14:49:01Z | en |
dc.date.available | 2024-04-08T14:49:01Z | en |
dc.date.issued | 2023-07 | en |
dc.description.abstract | This work demonstrates quasi-vertical GaN Schottky barrier diodes (SBDs) on 6-inch Si substrate with a breakdown voltage (BV) over 1 kV, the highest BV reported in vertical GaN-on-Si SBDs to date. The deep mesa inherently in quasi-vertical devices is leveraged to form a self-aligned edge termination, and the mesa sidewall is covered by the p-type nickel oxide (NiO) as a reduced surface field (RESURF) structure. This novel termination enables a parallel-plane junction electric field of 2.8 MV/cm. The device also shows low turn-on voltage of 0.5 V, and low specific on-resistance of 1.1 m ·cm2. Moreover, the device exhibits excellent overvoltage robustness under the continuous 800 V stress in the unclamped inductive switching test. These results show the good promise of the low-cost vertical GaN-on-Si power diodes. | en |
dc.description.sponsorship | This work was supported in part by the National Science Foundation under Grant ECCS-2230412 and Grant ECCS-2045001. | en |
dc.description.version | Accepted version | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.doi | https://doi.org/10.1109/LED.2023.3282025 | en |
dc.identifier.issue | 7 | en |
dc.identifier.uri | https://hdl.handle.net/10919/118510 | en |
dc.identifier.volume | 44 | en |
dc.language.iso | en | en |
dc.publisher | IEEE | en |
dc.rights | Creative Commons Attribution 4.0 International | en |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en |
dc.subject | Power electronics | en |
dc.subject | wide bandgap | en |
dc.subject | gallium nitride | en |
dc.subject | vertical device | en |
dc.subject | breakdown voltage | en |
dc.subject | reliability | en |
dc.title | 1 kV GaN-on-Si Quasi-Vertical Schottky Rectifier | en |
dc.title.serial | IEEE Electron Device Letters | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |