Residual strain gradients in a fully stabilized zirconia sample

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American Institute of Physics

Polished and severely ground fully stabilized zirconia samples are examined using primarily x‐ray diffraction(XRD). The XRD (111) profile reflections from both samples were broadened asymmetrically compared to that of an annealed sample. The asymmetry results from a d‐spacing gradient extending from the free surface into undisturbed bulk material. There are two possible origins of this depth gradient, i.e., variations in residual strain or chemical composition. The latter is eliminated by means of x‐ray photoelectron spectroscopy which did not reveal a chemical gradient. d‐spacing profiles for both samples are obtained nondestructively using a trial and error fitting procedure. A maximum compressive strain of ∼4% is obtained at the surface of the ground sample which decreases gradually to zero at greater depths. The overall zone is ∼1–2 μm. A similar but smaller compressive zone is found in the polished sample which is followed by a zone of tension. The maximum compressive strain at the surface is ∼5% and the overall zone of residual strain is ∼0.1 μm.

X-ray diffraction, Surface strains, Annealing, Bulk materials, Chemical composition
Hwang, B., Houska, C. R., Ice, G. E., Habenschuss, A. (1988). Residual strain gradients in a fully stabilized zirconia sample. Journal of Applied Physics, 63(11), 5351-5356. doi: 10.1063/1.340351