Multi-parameter X-ray computed tomography

dc.contributor.assigneeVirginia Tech Intellectual Properties, Inc.en
dc.contributor.inventorWang, Geen
dc.contributor.inventorCong, Wenxiangen
dc.date.accessed2016-08-19en
dc.date.accessioned2016-08-24T17:55:06Zen
dc.date.available2016-08-24T17:55:06Zen
dc.date.filed2010-06-04en
dc.date.issued2012-02-21en
dc.description.abstractThe present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide range of applications, including medical imaging, security screening, and industrial non-destructive testing to name a few. Specifically provided as embodiments of the invention are systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone. Such systems can be configured to comprise at least two collimator-and-detector assemblies or configurations differing with respect to collimator height, collimator aperture, imaging geometry, or distance between an object subjected to the imaging and the collimator-and-detector assembly.en
dc.format.mimetypeapplication/pdfen
dc.identifier.applicationnumber12794160en
dc.identifier.patentnumber8121249en
dc.identifier.urihttp://hdl.handle.net/10919/72673en
dc.identifier.urlhttp://pimg-fpiw.uspto.gov/fdd/49/212/081/0.pdfen
dc.language.isoen_USen
dc.publisherUnited States Patent and Trademark Officeen
dc.subject.cpcA61B6/06en
dc.subject.cpcA61B6/032en
dc.subject.cpcA61B6/4291en
dc.subject.cpcA61B6/583en
dc.subject.uspc378/6en
dc.subject.uspcother378/7en
dc.subject.uspcother378/70en
dc.subject.uspcother378/86en
dc.titleMulti-parameter X-ray computed tomographyen
dc.typePatenten
dc.type.dcmitypeTexten
dc.type.patenttypeutilityen
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