Ultra-Fast Electron Microscopic Imaging of Single Molecules With a Direct Electron Detection Camera and Noise Reduction

dc.contributor.authorStuckner, Joshuaen
dc.contributor.authorShimizu, Toshikien
dc.contributor.authorHarano, Kojien
dc.contributor.authorNakamura, Eiichien
dc.contributor.authorMurayama, Mitsuhiroen
dc.contributor.departmentMaterials Science and Engineeringen
dc.date.accessioned2020-12-16T13:29:40Zen
dc.date.available2020-12-16T13:29:40Zen
dc.date.issued2020-08en
dc.description.abstractTime-resolved imaging of molecules and materials made of light elements is an emerging field of transmission electron microscopy (TEM), and the recent development of direct electron detection cameras, capable of taking as many as 1,600 fps, has potentially broadened the scope of the time-resolved TEM imaging in chemistry and nanotechnology. However, such a high frame rate reduces electron dose per frame, lowers the signal-to-noise ratio (SNR), and renders the molecular images practically invisible. Here, we examined image noise reduction to take the best advantage of fast cameras and concluded that the Chambolle total variation denoising algorithm is the method of choice, as illustrated for imaging of a molecule in the 1D hollow space of a carbon nanotube with similar to 1 ms time resolution. Through the systematic comparison of the performance of multiple denoising algorithms, we found that the Chambolle algorithm improves the SNR by more than an order of magnitude when applied to TEM images taken at a low electron dose as required for imaging at around 1,000 fps. Open-source code and a standalone application to apply Chambolle denoising to TEM images and video frames are available for download.en
dc.description.notesThis research is supported by MEXT (KAKENHI 19H05459), Japan Science and Technology Agency (SENTAN JPMJSN16B1), and the National Science Foundation (EAPSI #1713989 and DMREF #1533969). J.S. and M.M. acknowledge the use of shared facilities at the Virginia Tech National Center for Earth and Environmental Nanotechnology Infrastructure (NanoEarth), a member of the National Nanotechnology Coordinated Infrastructure (NNCI), supported by NSF (ECCS 1542100), and a partial financial support by the grant DOE-BES DE-FG02-06ER15786 awarded by the U.S. Department of Energy. T.S. acknowledges financial support from the ALPS program (MEXT).en
dc.description.sponsorshipMEXTMinistry of Education, Culture, Sports, Science and Technology, Japan (MEXT) [KAKENHI 19H05459]; Japan Science and Technology AgencyJapan Science & Technology Agency (JST) [SENTAN JPMJSN16B1]; National Science Foundation (EAPSI)National Science Foundation (NSF) [1713989]; National Science Foundation (DMREF)National Science Foundation (NSF)NSF - Directorate for Computer & Information Science & Engineering (CISE) [1533969]; NSFNational Science Foundation (NSF) [ECCS 1542100]; U.S. Department of EnergyUnited States Department of Energy (DOE) [DOE-BES DE-FG02-06ER15786]; ALPS program (MEXT)en
dc.format.mimetypeapplication/pdfen
dc.identifier.doihttps://doi.org/10.1017/S1431927620001750en
dc.identifier.eissn1435-8115en
dc.identifier.issn1431-9276en
dc.identifier.issue4en
dc.identifier.otherPII S1431927620001750en
dc.identifier.pmid32684204en
dc.identifier.urihttp://hdl.handle.net/10919/101504en
dc.identifier.volume26en
dc.language.isoenen
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectdenoisingen
dc.subjectimage analysisen
dc.subjectimage processingen
dc.subjectsingle-molecule imagingen
dc.subjecttransmission electron microscopyen
dc.titleUltra-Fast Electron Microscopic Imaging of Single Molecules With a Direct Electron Detection Camera and Noise Reductionen
dc.title.serialMicroscopy And Microanalysisen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten
dc.type.dcmitypeStillImageen

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