Metalorganic chemical vapor deposition of ferroelectric SrBi2Ta2O9 thin films
dc.contributor | Virginia Tech | en |
dc.contributor.author | Li, T. K. | en |
dc.contributor.author | Zhu, Y. F. | en |
dc.contributor.author | Desu, Seshu B. | en |
dc.contributor.author | Peng, C. H. | en |
dc.contributor.author | Nagata, M. | en |
dc.contributor.department | Materials Science and Engineering (MSE) | en |
dc.date.accessed | 2014-03-27 | en |
dc.date.accessioned | 2014-04-16T14:16:44Z | en |
dc.date.available | 2014-04-16T14:16:44Z | en |
dc.date.issued | 1996-01-01 | en |
dc.description.abstract | Ferroelectric layered-oxides SrBi2Ta2O9 thin films were prepared on Pt coated Si wafers and single-crystal sapphire by metalorganic chemical vapor deposition (MOCVD). The films were specular and crack-free and showed complete crystallization at temperatures between 650 and 700 degrees C. Good ferroelectric properties were obtained for a 200 nm thick film with Pt electrodes: 2P(r) and E(c) were about 8.3 mu C/cm(2) and 60 kV/cm, respectively. The leakage currents were as low as 8 X 10(-9) A/cm(2) at 150 kV/cm. The films also showed fatigue-free characteristics: no fatigue was observed up to 1.4 X 10(10) switching cycles. These high quality MOCVD films make high-intensity (>1 Mbit) nonvolatile memory devices possible. (C) 1996 American Institute of Physics. | en |
dc.description.sponsorship | Sharp Corporation Japan | en |
dc.description.sponsorship | CERAM, Inc. of CO | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Li, TK; Zhu, YF; Desu, SB; et al., "Metalorganic chemical vapor deposition of ferroelectric SrBi2Ta2O9 thin films," Appl. Phys. Lett. 68, 616 (1996); http://dx.doi.org/10.1063/1.116486 | en |
dc.identifier.doi | https://doi.org/10.1063/1.116486 | en |
dc.identifier.issn | 0003-6951 | en |
dc.identifier.uri | http://hdl.handle.net/10919/47393 | en |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/apl/68/5/10.1063/1.116486 | en |
dc.language.iso | en_US | en |
dc.publisher | AIP Publishing | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Ferroelectric thin films | en |
dc.subject | Metal organic chemical vapor deposition | en |
dc.subject | Metallic thin films | en |
dc.subject | Ferroelectric materials | en |
dc.subject | Thin film deposition | en |
dc.title | Metalorganic chemical vapor deposition of ferroelectric SrBi2Ta2O9 thin films | en |
dc.title.serial | Applied Physics Letters | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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