Fermi level unpinning of GaSb (100) using plasma enhanced atomic layer deposition of Al2O3
dc.contributor | Virginia Tech | en |
dc.contributor.author | Ali, A. | en |
dc.contributor.author | Madan, H. S. | en |
dc.contributor.author | Kirk, A. P. | en |
dc.contributor.author | Zhao, D. A. | en |
dc.contributor.author | Mourey, D. A. | en |
dc.contributor.author | Hudait, Mantu K. | en |
dc.contributor.author | Wallace, R. M. | en |
dc.contributor.author | Jackson, T. N. | en |
dc.contributor.author | Bennett, B. R. | en |
dc.contributor.author | Boos, J. B. | en |
dc.contributor.author | Datta, Suman | en |
dc.contributor.department | Electrical and Computer Engineering | en |
dc.date.accessed | 2014-01-17 | en |
dc.date.accessioned | 2014-01-28T18:00:13Z | en |
dc.date.available | 2014-01-28T18:00:13Z | en |
dc.date.issued | 2010-10-01 | en |
dc.description.abstract | N-type and p-type GaSb metal-oxide-semiconductor capacitors (MOSCAPs) with atomic-layer-deposited (ALD) and plasma-enhanced-ALD (PEALD) Al2O3 dielectrics are studied to identify the optimum surface preparation and oxide deposition conditions for a high quality oxide-semiconductor interface. The ALD Al2O3/GaSb MOSCAPs exhibit strongly pinned C-V characteristics with high interface state density (D-it) whereas the PEALD Al2O3/GaSb MOSCAPs show unpinned C-V characteristics (low D-it). The reduction in Sb2O3 to metallic Sb is suppressed for the PEALD samples due to lower process temperature, identified by x-ray photoelectron spectroscopy analysis. Absence of elemental Sb is attributed to unpinning of Fermi level at the PEALD Al2O3/GaSb interface. (C) 2010 American Institute of Physics. [doi:10.1063/1.3492847] | en |
dc.description.sponsorship | SRC | en |
dc.description.sponsorship | DARPA | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Ali, A.; Madan, H. S.; Kirk, A. P.; et al., "Fermi level unpinning of GaSb (100) using plasma enhanced atomic layer deposition of Al2O3," Appl. Phys. Lett. 97, 143502 (2010); http://dx.doi.org/10.1063/1.3492847 | en |
dc.identifier.doi | https://doi.org/10.1063/1.3492847 | en |
dc.identifier.issn | 0003-6951 | en |
dc.identifier.uri | http://hdl.handle.net/10919/25171 | en |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/apl/97/14/10.1063/1.3492847 | en |
dc.language.iso | en | en |
dc.publisher | AIP Publishing | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | In-situ | en |
dc.subject | Substrate | en |
dc.subject | Physics | en |
dc.title | Fermi level unpinning of GaSb (100) using plasma enhanced atomic layer deposition of Al2O3 | en |
dc.title.serial | Applied Physics Letters | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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