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Subpixel Edge Location in Binary Images Using Dithering

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dc.contributor.authorLiu, Xiangdongen
dc.contributor.authorEhrich, Roger W.en
dc.contributor.departmentComputer Scienceen
dc.date.accessioned2013-06-19T14:37:11Zen
dc.date.available2013-06-19T14:37:11Zen
dc.date.issued1993-06-01en
dc.description.abstractThis paper concerns the problem of obtaining subpixel estimates of the locations of straight lines in digital images for purposes of machine vision. In particular, it presents a dithering method for improving the estimation accuracy on a rectangular sampling lattice. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and a novel approach is given for adding the dither by using grey-level image sensor and utilizing the imaging model.en
dc.format.mimetypeapplication/pdfen
dc.identifierhttp://eprints.cs.vt.edu/archive/00000353/en
dc.identifier.sourceurlhttp://eprints.cs.vt.edu/archive/00000353/01/TR-93-11.pdfen
dc.identifier.trnumberTR-93-11en
dc.identifier.urihttp://hdl.handle.net/10919/19832en
dc.language.isoenen
dc.publisherDepartment of Computer Science, Virginia Polytechnic Institute & State Universityen
dc.relation.ispartofHistorical Collection(Till Dec 2001)en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleSubpixel Edge Location in Binary Images Using Ditheringen
dc.typeTechnical reporten
dc.type.dcmitypeTexten

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