Calculation of x‐ray intensity from a rough sample based on a statistical model

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dc.contributorVirginia Tech. Department of Materials Engineeringen
dc.contributor.authorHwang, Bingen
dc.contributor.authorHouska, Charles R.en
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.date.accessed2015-04-24en
dc.date.accessioned2015-05-21T19:47:24Zen
dc.date.available2015-05-21T19:47:24Zen
dc.date.issued1988-06-01en
dc.description.abstractAn x‐ray intensity correction is developed which begins with a roughness model that is often used to describe real surfaces. This is based upon a normal distribution of surface asperities relative to a mean plane. Pair correlation between absorbing elements along x‐ray paths either entering or leaving the sample with respect to the signal producing element is accomplished by means of an exponential autocorrelation function. This allows the degree of roughness to be varied on a local scale to fit specific surfaces using statistical data. Equations are developed to describe x‐ray fluorescence and diffraction signals for symmetric and asymmetric beam optics. Theory is compared with experiment using a roughened, fully stabilized zirconia sample.en
dc.description.sponsorshipUnited States. Department of Energy. Conversion and Utilization Technologies (ECUT) Program No. 19B07733Cen
dc.format.extent6 pagesen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationHwang, B., Houska, C. R. (1988). Calculation of x‐ray intensity from a rough sample based on a statistical model. Journal of Applied Physics, 63(11), 5346-5350. doi: 10.1063/1.340350en
dc.identifier.doihttps://doi.org/10.1063/1.340350en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52428en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/63/11/10.1063/1.340350en
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectDiffraction opticsen
dc.subjectFluorescenceen
dc.subjectStatistical model calculationsen
dc.titleCalculation of x‐ray intensity from a rough sample based on a statistical modelen
dc.title.serialJournal of Applied Physicsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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