Thermal stability and electrical conductivity of carbon-enriched silicon oxycarbide

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dc.contributor.authorLu, Kathyen
dc.contributor.authorErb, Donalden
dc.contributor.authorLiu, Mengyingen
dc.contributor.departmentMaterials Science and Engineeringen
dc.date.accessioned2017-05-01T06:42:18Zen
dc.date.available2017-05-01T06:42:18Zen
dc.date.issued2016-01-28en
dc.description.abstractSilicon oxycarbide (SiOC) is an interesting polymer-derived system that can be tailored to embody many different properties such as lightweight, electrochemical activity, and high temperature stability. One intriguing property that has not been fully explored is the electrical conductivity for the carbon-rich SiOC compositions. In this study, a carbon-rich SiOC system is created based on the crosslinking and pyrolysis of polyhydromethylsiloxane (PHMS) and divinylbenzene (DVB) mixed precursors. The carbon-rich nature can effectively delay SiOC phase separation and crystallization into SiO2 and SiC during pyrolysis. In an oxidizing air atmosphere, the SiOC materials are stable up to 1000 °C with <0.5 wt% weight loss. Before the onset of electrical conductivity drop at ∼400 °C, the material has electrical conductivity as high as 4.28 S cm−1. In an inert argon atmosphere, the conductivity is as high as 4.64 S cm−1. This new semi-conducting behavior with high thermal stability presents promising application potential for high temperature MEMS devices, protective coatings, and bulk semi-conducting components that must endure high temperature conditions.en
dc.format.extent1829-1837en
dc.format.mimetypeapplication/pdfen
dc.identifierc6tc00069j.pdfen
dc.identifier.doihttps://doi.org/10.1039/c6tc00069jen
dc.identifier.eissn2050-7534en
dc.identifier.issn2050-7526en
dc.identifier.issue9en
dc.identifier.urihttp://hdl.handle.net/10919/77560en
dc.identifier.volume4en
dc.language.isoen_USen
dc.publisherRoyal Society of Chemistryen
dc.relation.ispartofRoyal Society of Chemistry Gold Open Access - 2016en
dc.rightsCreative Commons Attribution-NonCommercial 3.0 Unporteden
dc.rights.holderLu, Kathyen
dc.rights.holderErb, Donalden
dc.rights.holderLiu, Mengyingen
dc.rights.urihttp://creativecommons.org/licenses/by-nc/3.0/en
dc.titleThermal stability and electrical conductivity of carbon-enriched silicon oxycarbideen
dc.title.serialJournal of Materials Chemistry Cen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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