High Precision Refraction Measurements By Solar Imaging During Occultation: Results From Sofie
dc.contributor | Virginia Tech | en |
dc.contributor.author | Gordley, Larry L. | en |
dc.contributor.author | Burton, J. | en |
dc.contributor.author | Marshall, B. T. | en |
dc.contributor.author | McHugh, M. | en |
dc.contributor.author | Deaver, L. | en |
dc.contributor.author | Nelsen, J. | en |
dc.contributor.author | Russell, James M. III | en |
dc.contributor.author | Bailey, Scott M. | en |
dc.contributor.department | Electrical and Computer Engineering | en |
dc.date.accessed | 2014-02-24 | en |
dc.date.accessioned | 2014-04-04T15:12:19Z | en |
dc.date.available | 2014-04-04T15:12:19Z | en |
dc.date.issued | 2009-09-01 | en |
dc.description.abstract | A new method for measuring atmospheric refraction angles is presented, with in-orbit measurements demonstrating a precision of +/-0.02 arcsec (+/-0.1 mu rad). Key advantages of the method are the following: (1) Simultaneous observation of two celestial points during occultation (i.e., top and bottom edges of the solar image) eliminates error from instrument attitude uncertainty. (2) The refraction angle is primarily a normalized difference measurement, causing only scale error, not absolute error. (3) A large number of detector pixels are used in the edge location by fitting to a known edge shape. The resulting refraction angle measurements allow temperature sounding up to the lower mesosphere. (C) 2009 Optical Society of America | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Larry Gordley, John Burton, Benjamin T. Marshall, Martin McHugh, Lance Deaver, Joel Nelsen, James M. Russell, and Scott Bailey, "High precision refraction measurements by solar imaging during occultation: results from SOFIE," Appl. Opt. 48, 4814-4825 (2009). doi: 10.1364/AO.48.004814 | en |
dc.identifier.doi | https://doi.org/10.1364/AO.48.004814 | en |
dc.identifier.issn | 1559-128X | en |
dc.identifier.uri | http://hdl.handle.net/10919/46912 | en |
dc.identifier.url | http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-48-25-4814 | en |
dc.language.iso | en | en |
dc.publisher | Optical Society of America | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Atmosphere | en |
dc.subject | Inversion | en |
dc.title | High Precision Refraction Measurements By Solar Imaging During Occultation: Results From Sofie | en |
dc.title.serial | Applied Optics | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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