Epitaxial growth of Pb(Zr0.53Ti0.47)O-3 films on Pt coated magnetostrictive amorphous metallic substrates toward next generation multiferroic heterostructures

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dc.contributorVirginia Tech. Department of Materials Science and Engineeringen
dc.contributorNortheastern University. Center for Microwave Magnetic Materials and Integrated Circuitsen
dc.contributorNortheastern University. Department of Electrical and Computer Engineeringen
dc.contributorSoochow University. Department of Physics. Jiangsu Key Laboratory of Thin Filmsen
dc.contributor.authorHu, Bolinen
dc.contributor.authorChen, Yajieen
dc.contributor.authorYang, Aria F.en
dc.contributor.authorGillette, Scott M.en
dc.contributor.authorFitchorov, Trifonen
dc.contributor.authorGeiler, Anton L.en
dc.contributor.authorDaigle, Andrewen
dc.contributor.authorSu, X. D.en
dc.contributor.authorWang, Zhiguangen
dc.contributor.authorViehland, Dwight D.en
dc.contributor.authorHarris, Vincent G.en
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.date.accessed2015-04-24en
dc.date.accessioned2015-05-21T19:47:31Zen
dc.date.available2015-05-21T19:47:31Zen
dc.date.issued2012-03-15en
dc.description.abstractPiezoelectric films of Pb(Zr0.53Ti0.47)O-3 (PZT) were deposited by pulsed laser deposition onto metallic magnetostrictive substrates. In order to optimize the growth of PZT films, a buffer layer of Pt was employed, as well as variation of deposition temperature, pressure, and laser energy. Room temperature 0-20 x-ray diffraction measurements indicate all diffraction features correspond to reflections indexed to a single PZT phase of space group P4mm. Scanning electron microscopy images reveal pinhole-free dense films of pyramidal shaped crystal arrangements whose orientation and size were controlled by variation of oxygen pressures during deposition. The resulting PZT films had a value of d(33) similar to 46 pm/V representing a 53% increase over previous efforts to realize a piezoelectric/Metglas (TM) film heterostructure. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3697605]en
dc.format.extent6 pagesen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationHu, B., Chen, Y., Yang, A., Gillette, S., Fitchorov, T., Geiler, A., Daigle, A., Su, X. D., Wang, Z., Viehland, D., Harris, V. G. (2012). Epitaxial growth of Pb(Zr0.53Ti0.47)O-3 films on Pt coated magnetostrictive amorphous metallic substrates toward next generation multiferroic heterostructures. Journal of Applied Physics, 111(6). doi: 10.1063/1.3697605en
dc.identifier.doihttps://doi.org/10.1063/1.3697605en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52482en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/111/6/10.1063/1.3697605en
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectPZT filmsen
dc.subjectPiezoelectric transducersen
dc.subjectThin filmsen
dc.subjectPiezoelectric fieldsen
dc.subjectHeterojunctionsen
dc.titleEpitaxial growth of Pb(Zr0.53Ti0.47)O-3 films on Pt coated magnetostrictive amorphous metallic substrates toward next generation multiferroic heterostructuresen
dc.title.serialJournal of Applied Physicsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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