Displacement-Fields (U,W) Obtained Simultaneously By Moiré Interferometry

dc.contributor.authorBasehore, M. L.en
dc.contributor.authorPost, Danielen
dc.contributor.departmentBiomedical Engineering and Mechanicsen
dc.date.accessed2014-02-24en
dc.date.accessioned2014-04-04T15:12:15Zen
dc.date.available2014-04-04T15:12:15Zen
dc.date.issued1982-11-01en
dc.description.abstractA high-frequency phase grating on a specimen surface is illuminated symmetrically by two oblique beams. The diffracted beams emerge with wave front warpages that define both the in-plane U and out-of-plane W displacement fields. Contour maps of these wave fronts, with added carrier fringes, are obtained as a single photographic record. They are manipulated by moiré and optical filtering steps to yield whole-field fringe patterns of U and W. Sensitivities of 0.833 _m/fringe (32.8 _in./fringe) for in-plane displacements and 0.132 _m/fringe (5.2 _m./fringe) for out-of-plane displacements were demonstrated. Since data acquisition is experimentally simple, dynamic as well as static analyses are applicable.en
dc.description.sponsorshipNational Science Foundation ENG-7824609en
dc.format.mimetypeapplication/pdfen
dc.identifier.citationMichael L. Basehore and Daniel Post, "Displacement fields (U,W) obtained simultaneously by moiré interferometry," Appl. Opt. 21, 2558-2562 (1982). doi: 10.1364/AO.21.002558en
dc.identifier.doihttps://doi.org/10.1364/AO.21.002558en
dc.identifier.issn0003-6935en
dc.identifier.urihttp://hdl.handle.net/10919/46890en
dc.identifier.urlhttp://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-14-2558en
dc.language.isoen_USen
dc.publisherOptical Society of Americaen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleDisplacement-Fields (U,W) Obtained Simultaneously By Moiré Interferometryen
dc.title.serialApplied Opticsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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