Measurement Of Dynamic Polarization Modulation Depth Utilizing The J(1)-J(4) Method Of Spectrum Analysis

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dc.contributorVirginia Techen
dc.contributor.authorSudarshanam, V. S.en
dc.contributor.authorDesu, Seshu B.en
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.date.accessed2014-03-20en
dc.date.accessioned2014-04-09T18:12:22Zen
dc.date.available2014-04-09T18:12:22Zen
dc.date.issued1994-07-01en
dc.description.abstractA spectrum analysis method for the linear, direct, and self-consistent measurement of dynamic modulation depth of polarization modulators is presented. This method utilizes the Bessel recurrence relation to determine the modulation depth from the photodetector voltage amplitudes at the fundamental frequency and its next three harmonics. Based on the existing J1-J4 method of dynamic phase-shift measurement in homodyne interferometry, this method is useful for calibration of polarization modulated ellipsometers. The method is demonstrated through the use of a highly birefringent transparent thin film of piezoelectric polyvinylidene fluoride with indium tin oxide electrodes. The theoretical analysis of the measured noise factor for the particular system configuration predicted a minimum detectable polarization modulation depth of 0.2 rad, and was experimentally verified.en
dc.description.sponsorshipAdvanced Research Projects Agency through the Office of Naval Researchen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationSudarshanam, V. S.; Desu, S. B., "measurement of dynamic polarization modulation depth utilizing the j(1)-j(4) method of spectrum analysis," Rev. Sci. Instrum. 65, 2337 (1994); http://dx.doi.org/10.1063/1.1144685en
dc.identifier.doihttps://doi.org/10.1063/1.1144685en
dc.identifier.issn0034-6748en
dc.identifier.urihttp://hdl.handle.net/10919/47058en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/rsi/65/7/10.1063/1.1144685en
dc.language.isoen_USen
dc.publisherAIP Publishingen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectFiberoptic phase modulatoren
dc.subjectShift nonlinearityen
dc.titleMeasurement Of Dynamic Polarization Modulation Depth Utilizing The J(1)-J(4) Method Of Spectrum Analysisen
dc.title.serialReview of Scientific Instrumentsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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