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A simplified procedure for obtaining relative x‐ray intensities when a texture and atomic displacements are present

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dc.contributorVirginia Tech. Department of Materials Engineeringen
dc.contributor.authorHe, Baopingen
dc.contributor.authorRao, Satish I.en
dc.contributor.authorHouska, Charles R.en
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.date.accessed2015-04-24en
dc.date.accessioned2015-05-21T19:47:18Zen
dc.date.available2015-05-21T19:47:18Zen
dc.date.issued1994-05-01en
dc.description.abstractThe orientation problem in polycrystalline cubic materials has been simplified, using fundamental relationships, so that the determination of a quantitative interrelationship between the various Bragg peak intensities is no longer a formidable task. This is demonstrated with a cubic Cu-Be-Co alloy having a fiber texture, and a conventional focusing diffractometer. Because data are required which extend over a larger range in d spacings, extinction, thermal, and static atomic displacements must be included into the analysis of intensities. The displacement terms and the extinction parameters may be of primary interest or used as a correction. Seventeen diffraction peaks are used in the example. These must be internally consistent with a crystallite orientation function, the cubic symmetry of the sample, extinction effects influencing the two strongest peaks, and attenuation due to atomic displacements. Tabulated coefficients are presented which greatly reduce the task of calculating the orientation function. A correction is given for instrumental smearing which should be considered for stronger textures than the intermediate case examined or for intermediate textures and nonfocusing instrumental conditions.en
dc.format.extent10 pagesen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationHe, B. P., Rao, S., Houska, C. R. (1994). A simplified procedure for obtaining relative x‐ray intensities when a texture and atomic displacements are present. Journal of Applied Physics, 75(9), 4456-4464. doi: 10.1063/1.355960en
dc.identifier.doihttps://doi.org/10.1063/1.355960en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52398en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/75/9/10.1063/1.355960en
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectWave attenuationen
dc.subjectData analysisen
dc.subjectDiffractometersen
dc.subjectPolycrystalsen
dc.subjectThermal analysisen
dc.titleA simplified procedure for obtaining relative x‐ray intensities when a texture and atomic displacements are presenten
dc.title.serialJournal of Applied Physicsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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