Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability

dc.contributor.assignee	Virginia Tech Intellectual Properties, Inc.	en
dc.contributor.inventor	Hsiao, Michael S.	en
dc.contributor.inventor	Chandrasekar, Kameshwar	en
dc.date.accessed	2016-08-19	en
dc.date.accessioned	2016-08-24T17:54:44Z	en
dc.date.available	2016-08-24T17:54:44Z	en
dc.date.filed	2005-08-02	en
dc.date.issued	2008-04-08	en
dc.description.abstract	An all solutions automatic test pattern generation (ATPG) engine method uses a decision selection heuristic that makes use of the “connectivity of gates” in the circuit in order to obtain a compact solution-set. The “symmetry in search-states” is analyzed using a “Success-Driven Learning” technique which is extended to prune conflict sub-spaces. A metric is used to determine the use of learnt information a priori, which information is stored and used efficiently during “success driven learning”.	en
dc.format.mimetype	application/pdf	en
dc.identifier.applicationnumber	11194543	en
dc.identifier.patentnumber	7356747	en
dc.identifier.uri	http://hdl.handle.net/10919/72579	en
dc.identifier.url	http://pimg-fpiw.uspto.gov/fdd/47/567/073/0.pdf	en
dc.language.iso	en_US	en
dc.publisher	United States Patent and Trademark Office	en
dc.subject.cpc	G01R31/31837	en
dc.subject.cpc	G01R31/31830	en
dc.subject.uspc	714/738	en
dc.title	Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability	en
dc.type	Patent	en
dc.type.dcmitype	Text	en
dc.type.patenttype	utility	en

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