Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability

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dc.contributor.assigneeVirginia Tech Intellectual Properties, Inc.en
dc.contributor.inventorHsiao, Michael S.en
dc.contributor.inventorChandrasekar, Kameshwaren
dc.date.accessed2016-08-19en
dc.date.accessioned2016-08-24T17:54:44Zen
dc.date.available2016-08-24T17:54:44Zen
dc.date.filed2005-08-02en
dc.date.issued2008-04-08en
dc.description.abstractAn all solutions automatic test pattern generation (ATPG) engine method uses a decision selection heuristic that makes use of the “connectivity of gates” in the circuit in order to obtain a compact solution-set. The “symmetry in search-states” is analyzed using a “Success-Driven Learning” technique which is extended to prune conflict sub-spaces. A metric is used to determine the use of learnt information a priori, which information is stored and used efficiently during “success driven learning”.en
dc.format.mimetypeapplication/pdfen
dc.identifier.applicationnumber11194543en
dc.identifier.patentnumber7356747en
dc.identifier.urihttp://hdl.handle.net/10919/72579en
dc.identifier.urlhttp://pimg-fpiw.uspto.gov/fdd/47/567/073/0.pdfen
dc.language.isoen_USen
dc.publisherUnited States Patent and Trademark Officeen
dc.subject.cpcG01R31/31837en
dc.subject.cpcG01R31/31830en
dc.subject.uspc714/738en
dc.titleDecision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiabilityen
dc.typePatenten
dc.type.dcmitypeTexten
dc.type.patenttypeutilityen

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