Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • College of Science (COS)
    • Department of Chemistry
    • Scholarly Works, Department of Chemistry
    • View Item
    •   VTechWorks Home
    • College of Science (COS)
    • Department of Chemistry
    • Scholarly Works, Department of Chemistry
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    An atomic force microscope tip as a light source

    Thumbnail
    View/Open
    Main article (561.4Kb)
    Downloads: 470
    Date
    2005-12-01
    Author
    Lulevich, V.
    Honig, Christopher D. F.
    Ducker, William A.
    Metadata
    Show full item record
    Abstract
    We present a simple method for causing the end of a silicon nitride atomic force microscope (AFM) tip to emit light, and we use this emitted light to perform scanning near-field optical microscopy. Illumination of a silicon nitride AFM tip by blue (488 nm) or green (532 nm) laser light causes the sharp part of the tip to emit orange light. Orange light is emitted when the tip is immersed in either air or water; and while under illumination, emission continues for a period of many hours without photobleaching. By careful alignment of the incident beam, we can arrange the scattered light to decay as a function of the tip-substrate separation with a decay length of 100-200 nm. The exponential decay of the intensity means that the emitted light is dominated by contributions from parts of the tip that are near the sample, and therefore the emitted orange light can be used to capture high-resolution near-field optical images in air or water. (c) 2005 American Institute of Physics.
    URI
    http://hdl.handle.net/10919/25129
    Collections
    • Scholarly Works, Department of Chemical Engineering [131]
    • Scholarly Works, Department of Chemistry [199]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us