Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • College of Science (COS)
    • Department of Physics
    • Scholarly Works, Department of Physics
    • View Item
    •   VTechWorks Home
    • College of Science (COS)
    • Department of Physics
    • Scholarly Works, Department of Physics
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Spin and phase coherence lengths in InAs wires with diffusive boundary scattering

    Thumbnail
    View/Open
    Main article (905.1Kb)
    Downloads: 293
    Date
    2013-11-07
    Author
    Kallaher, R. L.
    Heremans, Jean J.
    Van Roy, W.
    Borghs, G.
    Metadata
    Show full item record
    Abstract
    Measurements of low-temperature magnetotransport in lithographic wires of submicron widths fabricated from high-mobility AlGaSb/InAs/AlGaSb two-dimensional electron system heterostructures are presented. The dependence of the spin and phase coherence lengths on wire width and diffusion constant is investigated by analyzing the conductance in low applied magnetic fields with antilocalization models. Predominantly diffusive boundary scattering is deduced from the magnitude and wire width dependence of the conductance. Diffusive boundary scattering leads to a diffusion constant decreasing with wire width and hence allows the dependence of spin coherence on wire width and diffusion constant to be investigated concurrently. The spin coherence lengths are experimentally found to be proportional to the ratio of the diffusion constant to wire width. The phase coherence lengths follow Nyquist decoherence for low-dimensional wires.
    URI
    http://hdl.handle.net/10919/25410
    Collections
    • Scholarly Works, Department of Physics [847]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us