Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • ETDs: Virginia Tech Electronic Theses and Dissertations
    • Doctoral Dissertations
    • View Item
    •   VTechWorks Home
    • ETDs: Virginia Tech Electronic Theses and Dissertations
    • Doctoral Dissertations
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Analysis and Reduction of Moire Patterns in Scanned Halftone Pictures

    Thumbnail
    View/Open
    etd.pdf (6.346Mb)
    Downloads: 154
    Date
    1996-05-01
    Author
    Liu, Xiangdong
    Metadata
    Show full item record
    Abstract
    In this dissertation we provide a comprehensive theory for the formation of a moire pattern in a sampled halftone image. We explore techniques for restoring a sampled halftone image with a moire pattern and techniques for preventing a moire pattern when a halftone picture is scanned. Specifically, we study the frequency, phase, and spatial geometry of a moire pattern. We observe and explain the half period phase reversal phenomenon that a moire pattern may exhibit. As a case study, we examine the moire patterns generated by a commercial scanner. We propose three restoration methods, including a notch filtering method, a simulation method, and a relaxation method. We also describe a moire prevention method, the partial inverse Fourier transform method. Finally, we propose a research agenda for further investigation.
    URI
    http://hdl.handle.net/10919/30304
    Collections
    • Doctoral Dissertations [14901]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us