Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • VTechWorks Archives
    • Conference Proceedings
    • Virginia Tech GIS and Remote Sensing Research Symposium
    • View Item
    •   VTechWorks Home
    • VTechWorks Archives
    • Conference Proceedings
    • Virginia Tech GIS and Remote Sensing Research Symposium
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Analysis of Crop Phenology Using Time-Series MODIS Data and Climate Data

    Thumbnail
    View/Open
    ren_poster.pdf (3.389Mb)
    Downloads: 1733
    Date
    2014
    Author
    Ren, Jie
    Campbell, James B. Jr.
    Shao, Yang
    Thomas, R. Quinn
    Metadata
    Show full item record
    Abstract
    Understanding crop phenology is fundamental to agricultural production, management, planning and decision-making. In the continental United States, key phenological stages are strongly influenced by meteorological and climatological conditions. This study used remote sensing satellite data and climate data to determine key phenological states of corn and soybean and evaluated estimates of these phenological parameters. A time series of Moderate Resolution Imaging Spectrometer (MODIS) Normalized Difference Vegetation Index (NDVI) 16-day composites from 2001 to 2013 was analyzed with the TIMESAT program to automatically retrieve key phenological stages such as the start of season (emergence), peak (heading) and end of season (maturity). These stages were simulated with 6 hourly temperature data from 1980 to 2013 on the basis of crop model under the Community Land Model (CLM) (version 4.5). With these two methods, planting date, heading date, harvesting date, and length of growing season from 2001 to 2013 were determined and compared. There should be a good correlation between estimates derived from satellites and estimates produced with the climate data based on the crop model.
    URI
    http://hdl.handle.net/10919/50677
    Collections
    • Scholarly Works, Center for Environmental Applications of Remote Sensing (CEARS) [10]
    • Virginia Tech GIS and Remote Sensing Research Symposium [77]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us