X‐ray diffraction analysis of concentration and residual stress gradients in nitrogen‐implanted niobium and molybdenum

TR Number
Date
1991-06-15
Journal Title
Journal ISSN
Volume Title
Publisher
American Institute of Physics
Abstract

Large biaxial residual strains are developed after a 5-at.% implantation of N into Nb and Mo. The results indicate that the dominant source of internal strain arises from N located in interstitial sites. For Nb implanted at liquid-nitrogen temperature, the N atoms are located in octahedral sites. However, the data allow for some clustering as di- or tri-interstitials at the highest concentration (approximately 5 at. % N). Radiation damage is present as small vacancy and interstitial loops. Since vacancies and self-interstitials are present in nearly equal concentrations, the overall bulk dilatation cancels. However, because of their small size, a lesser core expansion has been included as a correction to the overall residual strain. Although one can obtain an estimate of the N distribution from TRIM, a more accurate description must include the distribution of knock-on energy. The latter has an important influence on the redistribution of N relative to that predicted by TRIM. Both host lattices (Nb and Mo) behave like "rigid containers" in directions parallel to the free surface and give a magnified elastic response normal to the free surface.

Description
Keywords
Niobium, Molybdenum, Free surfaces, Interstitial defects, Vacancies
Citation
Rao, S. I., He, B. P., Houska, C. R., Grabowski, K. (1991). X‐ray diffraction analysis of concentration and residual stress gradients in nitrogen‐implanted niobium and molybdenum. Journal of Applied Physics, 69(12), 8111-8118. doi: 10.1063/1.347461