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dc.contributorVirginia Tech. Department of Materials Engineeringen
dc.contributor.authorAdler, Thomasen
dc.contributor.authorHouska, Charles R.en
dc.date.accessioned2015-05-21T19:47:30Zen
dc.date.available2015-05-21T19:47:30Zen
dc.date.issued1979en
dc.identifier.citationAdler, T., Houska, C. R. (1979). Simplifications in the x‐ray line‐shape analysis. Journal of Applied Physics, 50(5), 3282-3287. doi: 10.1063/1.326368en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52472en
dc.description.abstractIt is shown that a Fourier series associated with the Warren‐Averbach line‐shape analysis can be fitted with only five parameters to a pair of peaks. These interrelate the Fourier coefficients and thereby provide a simplified series which has been applied to the study of a Mo film on a Si crystal. The parameters include the average particle size, the first neighbor rms strain, a term which gives the variation in rms strain with cell separation, and two instrumental broadening coefficients. Although considerable simplification is possible, equivalent information can be obtained as compared with the original analysis and the ’’hook effect’’ is eliminated in the fitted coefficients.en
dc.description.sponsorshipNational Science Foundation (U.S.) - Grant No. DMR-17201en
dc.format.extent7 pagesen
dc.format.mimetypeapplication/pdfen
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectFourier analysisen
dc.subjectBiophysical techniquesen
dc.subjectMolybdenumen
dc.titleSimplifications in the x‐ray line‐shape analysisen
dc.typeArticle - Refereeden
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/50/5/10.1063/1.326368en
dc.date.accessed2015-04-24en
dc.title.serialJournal of Applied Physicsen
dc.identifier.doihttps://doi.org/10.1063/1.326368en
dc.type.dcmitypeTexten


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