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dc.contributor.authorFricker, Ronald D. Jr.en
dc.contributor.authorAnderson, Lewen
dc.date.accessioned2016-12-28T14:24:56Zen
dc.date.available2016-12-28T14:24:56Zen
dc.date.issued2015en
dc.identifier.urihttp://hdl.handle.net/10919/73881en
dc.description.abstractThis article was developed in parallel with the article, “The Survey Process: With an Emphasis on Survey Data Analysis,” published in the June edition of PHALANX. Together these articles discuss the importance of surveys as an essential tool for the contemporary national security operational analyst.en
dc.format.extent36 - 36 (42) page(s)en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleRaking: An Important and Often Overlooked Survey Analysis Toolen
dc.typeArticleen
dc.contributor.departmentStatisticsen
dc.description.notesfalse (Extension publication?)en
dc.description.notesPaper written and published as part of the authors' duties as US Government employees; the publisher does not hold copyright to the work.en
dc.title.serialPhalanxen
dc.identifier.volume48en
pubs.organisational-group/Virginia Techen
pubs.organisational-group/Virginia Tech/All T&R Facultyen
pubs.organisational-group/Virginia Tech/Scienceen
pubs.organisational-group/Virginia Tech/Science/COS T&R Facultyen
pubs.organisational-group/Virginia Tech/Science/Statisticsen


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