Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • ETDs: Virginia Tech Electronic Theses and Dissertations
    • Doctoral Dissertations
    • View Item
    •   VTechWorks Home
    • ETDs: Virginia Tech Electronic Theses and Dissertations
    • Doctoral Dissertations
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Accuracy analysis of the semi-analytical method for shape sensitivity analysis

    Thumbnail
    View/Open
    LD5655.V856_1987.B379.pdf (2.453Mb)
    Downloads: 794
    Date
    1987
    Author
    Barthelemy, Bruno
    Metadata
    Show full item record
    Abstract
    The semi-analytical method, widely used for calculating derivatives of static response with respect to design variables for structures modeled by finite elements, is studied in this research. The research shows that the method can have serious accuracy problems for shape design variables in structures modeled by beam, plate, truss, frame, and solid elements. Local and global indices are developed to test the accuracy of the semi-analytical method. The local indices provide insight into the problem of large errors for the semi-analytical method. Local error magnification indices are developed for beam and plane truss structures, and several examples showing the severity of the problem are presented. The global index provides us with a general method for checking the accuracy of the semi-analytical method for any type of model. It characterizes the difference in errors between a general finite-difference method and the semi-analytical method. Moreover, a method improving the accuracy of the semi-analytical method (when possible) is provided. Examples are presented showing the use of the global index.
    URI
    http://hdl.handle.net/10919/74754
    Collections
    • Doctoral Dissertations [16821]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us