Fast multi-level test generation at the RTL

dc.contributor.authorHsiao, Michael S.en
dc.contributor.authorGent, Kelsonen
dc.contributor.departmentElectrical and Computer Engineeringen
dc.date.accessioned2017-01-02T16:43:18Zen
dc.date.available2017-01-02T16:43:18Zen
dc.date.issued2016-07en
dc.description.abstractFunctional, at-speed vectors continue to provide added value to the testing community as circuit complexity rises. Complex defects may escape traditional scan vectors and thus often require at-speed patterns. However, generation of functional/sequential vectors is an extremely challenging problem. Previous methods rely on formal models of the RTL or calls to gate level ATPG, both of which are computationally expensive, limiting the efficacy of gains made in RTL stimuli generation. In this work, we present an efficient engine for the generation of high quality functional tests at the RTL which are effective for both validation and at-speed defect detection. The proposed method utilizes a rule based, behavioral coverage metric to accurately assess the activation of circuit modules by the generated stimuli. Based on this metric, we are able to effectively generate functional test vectors at the RTL, without additional gate level information, that can achieve a high level of defect coverage and up to an order of magnitude speedup over existing techniques.en
dc.description.notesYes, full paper (Peer reviewed?)en
dc.description.versionPublished versionen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/73916en
dc.language.isoenen
dc.relation.ispartofIEEE Annual Symposium on VLSIen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleFast multi-level test generation at the RTLen
dc.typeConference proceedingen
dc.type.dcmitypeTexten
pubs.organisational-group/Virginia Techen
pubs.organisational-group/Virginia Tech/All T&R Facultyen
pubs.organisational-group/Virginia Tech/Engineeringen
pubs.organisational-group/Virginia Tech/Engineering/COE T&R Facultyen
pubs.organisational-group/Virginia Tech/Engineering/Electrical and Computer Engineeringen
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