Sframe: An Efficient System for Detailed DC Simulation of Bipolar Analog Integrated Circuits Using Continuation Methods

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dc.contributor.authorMelville, Robert C.en
dc.contributor.authorMoinian, Shahriaren
dc.contributor.authorFeldman, Peteren
dc.contributor.authorWatson, Layne T.en
dc.contributor.departmentComputer Scienceen
dc.date.accessioned2013-06-19T14:36:36Zen
dc.date.available2013-06-19T14:36:36Zen
dc.date.issued1992en
dc.description.abstractIn this paper we describe an experimental system called sframe which is being incorporated into the design for manufacturability initiative at the Reading Works of AT&T Bell Laboratories. Our system is able to perform detailed and accurate DC analyses of integrated circuits containing several hundred transistors to be fabricated in a relatively complex junction isolated complementary technology.en
dc.format.mimetypeapplication/pdfen
dc.identifierhttp://eprints.cs.vt.edu/archive/00000332/en
dc.identifier.sourceurlhttp://eprints.cs.vt.edu/archive/00000332/01/TR-92-52.pdfen
dc.identifier.trnumberTR-92-52en
dc.identifier.urihttp://hdl.handle.net/10919/19778en
dc.language.isoenen
dc.publisherDepartment of Computer Science, Virginia Polytechnic Institute & State Universityen
dc.relation.ispartofHistorical Collection(Till Dec 2001)en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.titleSframe: An Efficient System for Detailed DC Simulation of Bipolar Analog Integrated Circuits Using Continuation Methodsen
dc.typeTechnical reporten
dc.type.dcmitypeTexten

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