Population difference of two_level atomic system due to a running pulsed field
dc.contributor | Virginia Tech. Engineering Science and Mechanics Department | en |
dc.contributor | Oak Ridge National Laboratory | en |
dc.contributor.author | Nayfeh, Munir H. | en |
dc.contributor.author | Nayfeh, Ali H. | en |
dc.contributor.department | Biomedical Engineering and Mechanics | en |
dc.date.accessed | 2015-04-24 | en |
dc.date.accessioned | 2015-06-01T16:10:45Z | en |
dc.date.available | 2015-06-01T16:10:45Z | en |
dc.date.issued | 1975 | en |
dc.description.abstract | The method of multiple scales is used to derive an expression for the population difference in an absorbing atomic system due to a running pulsed field. The main contribution to this expression comes from a quasi_steady_state part which has the same functional form as the hole produced by a continuous running field, except that the saturation parameter contains the time dependence of the field. The expression includes also an oscillatory term and a quasisteady term, which decay with a rate that is equal to the inverse of the lifetime of the levels. | en |
dc.format.extent | 4 pages | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Nayfeh, M. H., Nayfeh, A. H. (1975). POPULATION DIFFERENCE OF 2-LEVEL ATOMIC SYSTEM DUE TO A RUNNING PULSED FIELD. Journal of Applied Physics, 46(11), 4862-4864. doi: 10.1063/1.321520 | en |
dc.identifier.doi | https://doi.org/10.1063/1.321520 | en |
dc.identifier.issn | 0021-8979 | en |
dc.identifier.uri | http://hdl.handle.net/10919/52874 | en |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/jap/46/11/10.1063/1.321520 | en |
dc.language.iso | en_US | en |
dc.publisher | American Institute of Physics | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Atomic systems | en |
dc.subject | Pulsed fields | en |
dc.title | Population difference of two_level atomic system due to a running pulsed field | en |
dc.title.serial | Journal of Applied Physics | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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