Interplay between strain and thickness on effective carrier lifetime of buffer mediated epitaxial germanium probed by photoconductance decay technique
TR Number
Date
2023-05-19
Journal Title
Journal ISSN
Volume Title
Publisher
American Chemical Society
Abstract
Description
Keywords
germanium, carrier lifetime, tensile strain, molecular beam epitaxy, x-ray diffraction, photoconductance, bulk lifetime, surface recombinationvelocity