2T-1C ferroelectric random access memory and operation method thereof
dc.contributor.assignee | SAMSUNG ELECTRONICS CO., LTD. | en |
dc.contributor.assignee | Virginia Tech Intellectual Properties, Inc. | en |
dc.contributor.inventor | Yoo, In-kyeong | en |
dc.date.accessed | 2016-08-19 | en |
dc.date.accessioned | 2016-08-24T17:54:17Z | en |
dc.date.available | 2016-08-24T17:54:17Z | en |
dc.date.filed | 2000-09-11 | en |
dc.date.issued | 2002-06-11 | en |
dc.description.abstract | A 2T-1C FRAM, each cell of which includes two transistors and one ferroelectric capacitor so that the “charging” and “discharging” of the ferroelectric capacitor used in conjunction with the p-n junction of the two transistors performs write/read operations without switching thereby avoiding degradation problems such as fatigue and imprint in the 2T-1C FRAM. | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.applicationnumber | 9658942 | en |
dc.identifier.patentnumber | 6404667 | en |
dc.identifier.uri | http://hdl.handle.net/10919/72449 | en |
dc.identifier.url | http://pimg-fpiw.uspto.gov/fdd/67/046/064/0.pdf | en |
dc.language.iso | en_US | en |
dc.publisher | United States Patent and Trademark Office | en |
dc.subject.cpc | G11C11/22 | en |
dc.subject.uspc | 365/145 | en |
dc.subject.uspcother | 365/189.4 | en |
dc.subject.uspcother | 365/189.15 | en |
dc.subject.uspcother | 365/189.16 | en |
dc.subject.uspcother | 365/200 | en |
dc.subject.uspcother | 365/210.1 | en |
dc.subject.uspcother | 365/210.15 | en |
dc.title | 2T-1C ferroelectric random access memory and operation method thereof | en |
dc.type | Patent | en |
dc.type.dcmitype | Text | en |
dc.type.patenttype | utility | en |
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