Dielectric characterization using a Wideband Dielectric Filled Cavity (WDFC)

dc.contributor.authorSaed, Mohammed Alien
dc.contributor.committeechairRiad, Sedkien
dc.contributor.committeememberBesieris, Ioannis M.en
dc.contributor.committeememberBrown, Garyen
dc.contributor.committeememberDavis, William A.en
dc.contributor.committeememberElshabini-Riad, Aicha A.en
dc.contributor.committeememberRiess, R. Deanen
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2015-05-14T16:36:15Zen
dc.date.available2015-05-14T16:36:15Zen
dc.date.issued1987en
dc.description.abstractThis dissertation summarizes the research performed towards the development, analysis, and testing of two new sample configurations used for characterizing dielectric materials over a wide band of frequencies. In the two configurations, a cylindrical cavity completely filled with a sample of the dielectric material of interest is used. The two configurations are the following: 1. The cylindrical cavity is adapted to the end of a transmission line and the reflection coefficient is measured. The complex permittivity of the dielectric sample is then derived from the measured reflection coefficient information. 2. The cylindrical cavity is placed between two transmission lines. The complex permittivity of the dielectric material can be computed from either the measured reflection coefficient or the measured transmission coefficient. The full field analysis of these configurations is carried out and the solution is obtained using the method of moments. Computer simulation experiments are performed to test the sensitivity of these techniques and predict their performance. Actual experiments on some dielectric materials with known dielectric properties are performed for verification. The first configuration is also used to characterize two thick film dielectric materials. These configurations proved to provide solutions to the many problems with the conventional configurations found in the literature.en
dc.description.degreePh. D.en
dc.format.extentvii, 199 leavesen
dc.format.mimetypeapplication/pdfen
dc.identifier.urihttp://hdl.handle.net/10919/52317en
dc.language.isoen_USen
dc.publisherVirginia Polytechnic Institute and State Universityen
dc.relation.isformatofOCLC# 17680689en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V856 1987.S234en
dc.subject.lcshBreakdown (Electricity)en
dc.subject.lcshDielectric measurementsen
dc.titleDielectric characterization using a Wideband Dielectric Filled Cavity (WDFC)en
dc.typeDissertationen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.leveldoctoralen
thesis.degree.namePh. D.en

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