Effects of van der Waals force and thermal stresses on pull-in instability of clamped rectangular microplates

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Date

2008-02-01

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Journal ISSN

Volume Title

Publisher

MDPI

Abstract

We study the influence of von Karman nonlinearity, van der Waals force, and thermal stresses on pull-in instability and small vibrations of electrostatically actuated microplates. We use the Galerkin method to develop a tractable reduced-order model for electrostatically actuated clamped rectangular microplates in the presence of van der Waals forces and thermal stresses. More specifically, we reduce the governing two-dimensional nonlinear transient boundary-value problem to a single nonlinear ordinary differential equation. For the static problem, the pull-in voltage and the pull-in displacement are determined by solving a pair of nonlinear algebraic equations. The fundamental vibration frequency corresponding to a deflected configuration of the microplate is determined by solving a linear algebraic equation. The proposed reduced-order model allows for accurately estimating the combined effects of van der Waals force and thermal stresses on the pull-in voltage and the pull-in deflection profile with an extremely limited computational effort.

Description

Keywords

Technology, Chemistry, Analytical, Electrochemistry, Instruments & Instrumentation, Chemistry, microelectromechanical systems, microplate, van der Waals force, pull-in instability, microsensor, ENCAPSULATED POLYSILICON RESONATORS, ACTUATED NARROW MICROBEAMS, REDUCED-ORDER MODEL, ELECTROSTATIC MEMS, CIRCULAR PLATES, MODAL-ANALYSIS, TEMPERATURE, PRESSURE, BEHAVIOR, FIELD

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