A case study in automated testing

dc.contributor.authorDaigneault, Thomas E.en
dc.contributor.committeechairBlanchard, Benjamin S. Jr.en
dc.contributor.committeememberFabrycky, Wolter J.en
dc.contributor.committeememberMintz, Franken
dc.contributor.departmentSystems Engineeringen
dc.date.accessioned2014-03-14T21:32:31Zen
dc.date.adate2010-03-30en
dc.date.available2014-03-14T21:32:31Zen
dc.date.issued1993-04-15en
dc.date.rdate2010-03-30en
dc.date.sdate2010-03-30en
dc.description.abstractAs electronics technology has become more complex over the past few years, finding a suitable and cost-effective testing method has become increasingly difficult. Very Large Scale Integration (VLSI) packaging technologies are making accurate diagnosis of printed circuit boards more costly and time-consuming. Furthermore, a number of business-related factors impact the suitability of any test approach. The purpose of this project is the application of system engineering methodologies in the selection of the best-automated testing approach for a new system. The system engineering effort will transform an operational need into a description of system performance parameters and a preferred system configuration through the interactive process of requirements definition, functional analysis, synthesis, optimization, and requirement allocation. The integration of technical parameters will assure the capability of all physical, functional, and program interfaces in a manner that optimizes the total system design and definition. An up-front engineering effort will help to identify acquisition cost and the ongoing costs of operation and maintenance, both of which have equally important roles in determining the optimum test strategy.en
dc.description.degreeMaster of Scienceen
dc.format.extentv, 107 pages, 4 unnumbered leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-03302010-020301en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-03302010-020301/en
dc.identifier.urihttp://hdl.handle.net/10919/41831en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V851_1993.D354.pdfen
dc.relation.isformatofOCLC# 28602353en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V851 1993.D354en
dc.subject.lcshAutomatic test equipmenten
dc.subject.lcshIntegrated circuits -- Testingen
dc.titleA case study in automated testingen
dc.typeMaster's projecten
dc.type.dcmitypeTexten
thesis.degree.disciplineSystems Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.levelmastersen
thesis.degree.nameMaster of Scienceen
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