Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO3-CoFe2O4 nanocomposite thin films
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Date
2009-05-01
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Publisher
AIP Publishing
Abstract
We report the direct measurement of a magnetoelectric (ME) exchange between magnetostrictive CoFe2O4 nanopillars in a piezoelectric BiFeO3 matrix for single-layer nanocomposite epitaxial thin films grown on (001) SrTiO3 substrates with SrRuO3 bottom electrodes. The ME coefficient was measured by a magnetic cantilever method and had a maximum value of similar to 20 mV/cm Oe. The films possessed saturation polarization (60 mu C/cm(2)) and magnetization (410 emu/cc) properties equivalent to bulk values, with typical hysteresis loops.
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Keywords
Bismuth compounds, Cobalt compounds, Dielectric polarisation, Magnetic, Epitaxial layers, Magnetic hysteresis, Magnetoelectric effects, Nanocomposites, Piezoelectric thin films, Batio3-cofe2o4 nanostructures, Multiferroic nanostructures, Laminates, Composite materials, Heterostructures, Physics
Citation
Yan, Li; Xing, Zengping; Wang, Zhiguang; et al., "Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO3-CoFe2O4 nanocomposite thin films," Appl. Phys. Lett. 94, 192902 (2009); http://dx.doi.org/10.1063/1.3138138