Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO3-CoFe2O4 nanocomposite thin films
dc.contributor | Virginia Tech | en |
dc.contributor.author | Yan, Li | en |
dc.contributor.author | Xing, Zengping | en |
dc.contributor.author | Wang, Z. G. | en |
dc.contributor.author | Wang, T. | en |
dc.contributor.author | Lei, G. Y. | en |
dc.contributor.author | Li, Jiefang | en |
dc.contributor.author | Viehland, Dwight D. | en |
dc.contributor.department | Materials Science and Engineering (MSE) | en |
dc.date.accessed | 2014-01-17 | en |
dc.date.accessioned | 2014-01-28T18:00:12Z | en |
dc.date.available | 2014-01-28T18:00:12Z | en |
dc.date.issued | 2009-05-01 | en |
dc.description.abstract | We report the direct measurement of a magnetoelectric (ME) exchange between magnetostrictive CoFe2O4 nanopillars in a piezoelectric BiFeO3 matrix for single-layer nanocomposite epitaxial thin films grown on (001) SrTiO3 substrates with SrRuO3 bottom electrodes. The ME coefficient was measured by a magnetic cantilever method and had a maximum value of similar to 20 mV/cm Oe. The films possessed saturation polarization (60 mu C/cm(2)) and magnetization (410 emu/cc) properties equivalent to bulk values, with typical hysteresis loops. | en |
dc.description.sponsorship | U.S. Department of Energy_DE-AC02-98CH10886 | en |
dc.description.sponsorship | Office of the Air-Force Office of Scientific Research FA 9550-06-1-0410 | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Yan, Li; Xing, Zengping; Wang, Zhiguang; et al., "Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO3-CoFe2O4 nanocomposite thin films," Appl. Phys. Lett. 94, 192902 (2009); http://dx.doi.org/10.1063/1.3138138 | en |
dc.identifier.doi | https://doi.org/10.1063/1.3138138 | en |
dc.identifier.issn | 0003-6951 | en |
dc.identifier.uri | http://hdl.handle.net/10919/25163 | en |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/apl/94/19/10.1063/1.3138138 | en |
dc.language.iso | en_US | en |
dc.publisher | AIP Publishing | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Bismuth compounds | en |
dc.subject | Cobalt compounds | en |
dc.subject | Dielectric polarisation | en |
dc.subject | Magnetic | en |
dc.subject | Epitaxial layers | en |
dc.subject | Magnetic hysteresis | en |
dc.subject | Magnetoelectric effects | en |
dc.subject | Nanocomposites | en |
dc.subject | Piezoelectric thin films | en |
dc.subject | Batio3-cofe2o4 nanostructures | en |
dc.subject | Multiferroic nanostructures | en |
dc.subject | Laminates | en |
dc.subject | Composite materials | en |
dc.subject | Heterostructures | en |
dc.subject | Physics | en |
dc.title | Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO3-CoFe2O4 nanocomposite thin films | en |
dc.title.serial | Applied Physics Letters | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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