Surface-Mount Sapphire Interferometric Temperature Sensor

Abstract

A fiber-optic high-temperature sensor is demonstrated by bonding a 45 degrees-polished single-crystal sapphire fiber on the surface of a sapphire wafer, whose optical thickness is temperature dependent and measured by white-light interferometry. A novel adhesive-free coupling between the silica and sapphire fibers is achieved by fusion splicing, and its performance is characterized. The sensor's interference signal is investigated for its dependence on angular alignment between the fiber and the wafer. A prototype sensor is tested to 1170 degrees C with a resolution of 0.4 degrees C, demonstrating excellent potential for high-temperature measurement. (C) 2006 Optical. Society of America.