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Surface-Mount Sapphire Interferometric Temperature Sensor

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dc.contributorVirginia Techen
dc.contributor.authorZhu, Y. Z.en
dc.contributor.authorWang, Anboen
dc.contributor.departmentCenter for Photonics Technologyen
dc.date.accessed2014-02-24en
dc.date.accessioned2014-04-04T15:12:28Zen
dc.date.available2014-04-04T15:12:28Zen
dc.date.issued2006-02-01en
dc.description.abstractA fiber-optic high-temperature sensor is demonstrated by bonding a 45 degrees-polished single-crystal sapphire fiber on the surface of a sapphire wafer, whose optical thickness is temperature dependent and measured by white-light interferometry. A novel adhesive-free coupling between the silica and sapphire fibers is achieved by fusion splicing, and its performance is characterized. The sensor's interference signal is investigated for its dependence on angular alignment between the fiber and the wafer. A prototype sensor is tested to 1170 degrees C with a resolution of 0.4 degrees C, demonstrating excellent potential for high-temperature measurement. (C) 2006 Optical. Society of America.en
dc.description.sponsorshipU.S. Department of Energy DE-FC26-99FT40685en
dc.format.mimetypeapplication/pdfen
dc.identifier.citationYizheng Zhu and Anbo Wang, "Surface-mount sapphire interferometric temperature sensor," Appl. Opt. 45, 6071-6076 (2006). doi: 10.1364/AO.45.006071en
dc.identifier.doihttps://doi.org/10.1364/AO.45.006071en
dc.identifier.issn1559-128Xen
dc.identifier.urihttp://hdl.handle.net/10919/46967en
dc.identifier.urlhttp://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-24-6071en
dc.language.isoen_USen
dc.publisherOptical Society of Americaen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectOptical-fiber thermometeren
dc.titleSurface-Mount Sapphire Interferometric Temperature Sensoren
dc.title.serialApplied Opticsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

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