Dielectric loss determination using perturbation

dc.contributor.authorAndrawis, Madeleine Y.en
dc.contributor.committeecochairDavis, William A.en
dc.contributor.committeecochairRiad, Sedki Mohameden
dc.contributor.committeememberBesieris, Ioannis M.en
dc.contributor.committeememberElshabini-Riad, Aicha A.en
dc.contributor.committeememberKohler, Werner E.en
dc.contributor.committeememberBrown, Gary S.en
dc.contributor.departmentElectrical Engineeringen
dc.date.accessioned2014-03-14T21:20:43Zen
dc.date.adate2005-10-10en
dc.date.available2014-03-14T21:20:43Zen
dc.date.issued1991-12-08en
dc.date.rdate2005-10-10en
dc.date.sdate2005-10-10en
dc.description.abstractA dielectric filled cavity structure is currently being used to estimate the dielectric constant and loss factor over a wide range of frequencies of a dielectric material which fills the cavity structure [Saed, 1987]. A full field analysis is used to compute the effective complex permittivity of the sample material based on reflection coefficient measurements of the cavity structure and associated geometrical dimensions. The method has previously been used successfully to determine the dielectric constant of materials, but limitations in the Inethod have created difficulties in accurate determination of the dielectric loss factor. The effective loss in this method yields an estimate of the total cavity loss, including both the dielectric loss and that of the cavity conductor walls. In this dissertation a perturbation approach is used to separate the conductor loss from the total loss. The loss-free full-field analysis is used to determine the electric current at the conductor boundaries. This current is used to evaluate the perturbed power dissipated in the cavity walls based on known conductor properties. By subtracting the loss due to the conductor walls from the total loss measured in the structure, the dielectric loss and the resultant dielectric loss factor may be estimated. Measurements are presented for sample dielectric materials. The dielectric loss tangents computed by this new technique improve the unperturbed estimates in the microwave frequency range.en
dc.description.degreePh. D.en
dc.format.extentv, 134 leavesen
dc.format.mediumBTDen
dc.format.mimetypeapplication/pdfen
dc.identifier.otheretd-10102005-131557en
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-10102005-131557/en
dc.identifier.urihttp://hdl.handle.net/10919/39715en
dc.language.isoenen
dc.publisherVirginia Techen
dc.relation.haspartLD5655.V856_1991.A5365.pdfen
dc.relation.isformatofOCLC# 27864286en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.lccLD5655.V856 1991.A5365en
dc.subject.lcshCavity resonatorsen
dc.subject.lcshConvergenceen
dc.subject.lcshDielectric lossen
dc.subject.lcshPerturbation (Mathematics)en
dc.titleDielectric loss determination using perturbationen
dc.typeDissertationen
dc.type.dcmitypeTexten
thesis.degree.disciplineElectrical Engineeringen
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen
thesis.degree.leveldoctoralen
thesis.degree.namePh. D.en
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